Hi
we are using NXP 2N7002P Mosfet in pne of our Production Test Setup design which is getting damaged frequently.
Gate is controlled by GPIO from NXP LPC 1833 Controller. Drain Is pulled up from external DUT and Used for Resetting the DUT (Device under test)
Please Help Us on this.
Hi,
2N7002P is N-Channel Mosfet Please see the datasheet Link
https://assets.nexperia.com/documents/data_sheet/2N7002P.pdf
Best Regards,
Abhilash Surendran
VVDN Technologies Pvt Ltd
Cell: +91 9809305675 | Skype : abhilashsurendran@hotmail.com
Hi,
The gate is controlled by NXP LPC1833 GPIO 3.3V.
VDS 60V Mosfet was available in our stock. That's why we have chosen that.
Best Regards,
Abhilash Suredran
VVDN Technologies Pvt Ltd
Cell: +91 9809305675 | Skype : abhilashsurendran@hotmail.com
Hi,
This kind of standard products had already transfered to ----www.nexperia.cn last year.
Please also contact with them for detail.
Anyway from my side,please check the GATE drive signal and voltage level.
I don't see the pull up resistor value and pull up voltage of drain pin,please also check.
Hi guoweisun
The pull up is there at the end where the device Under test is connected.
Pulled up to 3.3 Via 10 Resistor. The drain of the MOSFET comes in contact
to TP63 test point in DUT as shown in image attached.
Best Regards,
Abhilash Suredran
VVDN Technologies Pvt Ltd
Cell: +91 9809305675 | Skype : abhilashsurendran@hotmail.com