Hello,
I have reviewed the PCA2131 qualification results. Unfortunately, the report we have does not directly quantify accuracy degradation over time at different temperatures. However, it does show that the tested components underwent various reliability stress tests, including HTOL, HAST, TMCL, and HTSL, with zero failures during the test periods.
For example, see below the results of the High-Temperature Operational Life (HTOL) test:
"This test is the primary method for determining the long-term reliability of the product. Generally, the influence of the package on this test is limited. Nevertheless, it is included to demonstrate the long-term reliability of the product/package combination."
This suggests that, within the tested timeframe, the device remains functional without significant accuracy loss. However, prolonged exposure beyond the tested limits (e.g., over many years) could degrade performance due to factors such as oxidation or material degradation.
Hope this helps.
