Example MPC5744P 1b+2b_FLASH_ECC_error_by_UTEST_area_read GHS614

File uploaded by David Tosenovjan Employee on Jan 13, 2017Last modified by David Tosenovjan Employee on Dec 28, 2017
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* Detailed Description:
* Purpose of the example is to show how to generate Multi-bit or Single-bit ECC
* error in internal FLASH (user must choose it in the option at the end of main
* function).
* ECC error is injected by reading of pre-defined patterns in UTEST area at
* addresses 0x00400040 and 0x00400060.
* When corrupted data is accessed the IVOR1 exception handler is called in case
* of multi-bit ECC error (IVOR1 exception occurs) and FCCU_Alarm_Interrupt
* handler is called in case of single-bit ECC error (FCCU interrupt occurs).
* Both function calls MEMU handler.
* The example displays notices in the terminal window (connector J19 on
* MPC57xx_Motherboard)(19200-8-no parity-1 stop bit-no flow control on eSCI_A).
* No other external connection is required.
* ------------------------------------------------------------------------------
* Test HW:         MPC57xx_Motherboard + MPC5744P-144DC
* MCU:             PPC5744PFMLQ8,0N15P,QQAA1515N, Rev2.1B
* Fsys:            200 MHz PLL with 40 MHz crystal reference
* Debugger:        Lauterbach Trace32
* Target:          internal_FLASH, RAM
* Terminal:        19200-8-no parity-1 stop bit-no flow control
* EVB connection:  default