S32K312 Destructive reset and functional reset query

[raj12]

Hello

I have query related to destructive reset and functional reset.

1. How to create the test scenario for testing of PLL_LOL in case of destructive reset else destructive reset will trigger by MCU automatically once event will trigger.
2. How to create the test scenario for testing of SYS_DIV_FAIL in case of destructive reset else destructive reset will trigger by MCU automatically once event will trigger.
3. How to create the test scenario for testing of DEBUG_DEST in case of destructive reset else destructive reset will trigger by MCU automatically once event will trigger.

1. How to create the test scenario for testing of PLL_AUX_RST in case of functional reset else functional reset will trigger by MCU automatically once event will trigger.
2. How to create the test scenario for testing of JTAG_RST in case of functional reset else functional reset will trigger by MCU automatically once event will trigger.
3. How to create the test scenario for testing of DEBUG_FUNC in case of functional reset else functional reset will trigger by MCU automatically once event will trigger.

Please provide the inline reply. If demo software is available, the provide us. It will be helpful for our development.

Thanks

[vihera]

I'm investigating the same fault list for S32K324/344.

The only I could trigger is PLL_LOL by shorting to ground one of the Capacitors connected to the embedded oscillator.