fs26 initialization phase ABIST 1 (Analog Built-In Self-Test 1) failed

[MNN]

I use the EB program Sbc_fs26_S32k344 in FS26_4.4_1.0.0_CD01_D2208.exe to test. I found that the Sbc_fs26_InitDevice() procedure did not run successfully. Debug to Sbc_fs26_InitDevice and find that Sbc_fs26_CheckLBistABist1() failed, and the value read from SBC_FS26_FS_DIAG_SAFETY1_ADDR is 0x0003. According to the data sheet, Diagnostic on ABIST 1 Fail or not executed, LBIST OK。When the program executes all operations that enter normal, after reading the value of the FS_STATES register, it is found that FS26 does not enter normal mode, but in Enable Monitoring
1. I want to ask what may be the reason for this situation? How to solve it?
2. What happens if ABIST 1 fails?

[guoweisun · Accepted solution]

上面图是ABIST要检测的内容看看您的实际芯片OTP以后 ABIST都检测什么？有没有OV/UV等等明显的错误。

ABIST检测fail以后SBC可能进入低功耗模式，这个时候MCU有可能是可以工作的你可以查询FS_OVUV_REG_STATUS register内容看看哪里的错误，如果ABIST fail以后SBC一直在重启可能就无法查询错误来源。

[guoweisun]

附件有一个OTP的文档是具体的芯片-MFS2613AMDA4他的OTP文档可以在官网下载，看看内容：

基本上所有的监控管脚都ENABLE了在ABIST的阶段，像这样的情况就是每一个都要去测试看看是哪个出了问题比方说VPRE/VCORE/VLOD等等看看他们有没有UV/OV的错误，如果有就改正过来ABIST就会pass

[MNN]

谢谢，我在ABIST fail后，我成功读取FS_OVUV_REG_STATUS里面的值，发现有引脚高压和欠压。我想问，我可以通过OTP的配置，改变ABIST阶段检测的引脚吗？

[guoweisun]

OTP做过了就不能再改了，还是改改电路上的比方说哪一路出了问题就把那一路好好修改下电路对比着参考设计。

[MNN]

谢谢你的答复。