[LX2160A] SEC return error when run dpdk application

[Jeffrey_Lai]

Hi NXP,

We have an issue when run our dpdk application on LX2160A.

After run our dpak application after few hours, we get "SEC returned Error - 400000f1" message.

We try to trace dpdk source and find out if increase dpaa2_dpcp_ctxt struct hfn_threshold value, the issue has been postponed.

Do you get any similar issues and how to solve it ?

Could you tell us hfn_threshold is used for ?

Thank you,

Jeffrey Lai

[yipingwang]

Please refer to app/test/test_cryptodev.c in DPDK source code, there are some unite test cases containing the section how to use Scatter Gather buffers which are supported in DPAA_SEC driver.

Would you please check whether you used Scatter Gather buffers similar as this test case.

                TEST_CASE_ST(ut_setup, ut_teardown,

                             test_AES_chain_dpaa_sec_all),

                TEST_CASE_ST(ut_setup, ut_teardown,

                             test_3DES_chain_dpaa_sec_all),

                TEST_CASE_ST(ut_setup, ut_teardown,

                             test_AES_cipheronly_dpaa_sec_all),

                TEST_CASE_ST(ut_setup, ut_teardown,

                             test_3DES_cipheronly_dpaa_sec_all),

                TEST_CASE_ST(ut_setup, ut_teardown,

                             test_authonly_dpaa_sec_all),

                /** Scatter-Gather */

                TEST_CASE_ST(ut_setup, ut_teardown,

                        test_AES_GCM_auth_encrypt_SGL_in_place_1500B),

                TEST_CASE_ST(ut_setup, ut_teardown,

                        test_AES_GCM_auth_encrypt_SGL_out_of_place_400B_400B),

                TEST_CASE_ST(ut_setup, ut_teardown,

                        test_AES_GCM_auth_encrypt_SGL_out_of_place_400B_1seg),

                TEST_CASE_ST(ut_setup, ut_teardown,

                        test_AES_GCM_auth_encrypt_SGL_out_of_place_1500B_2000B),

[yipingwang]

Which version LSDK are your using?

[Jeffrey_Lai]

Hi Yiping,

We use LSDK 20.04

Jeffrey