Hello,
According to the flash characteristics of KEA128 DS, the condition is about average junction temperature, but I couldn't find it in DS, it is written only in this table. Could you explain about it and why this condition was used for data retention?
Best regards,
Kate Lee
Hi,
Please check here about how NXP defines typical data retention in the product spec of nonvolatile memory(NVM).
Wish it helps.
Have a great day,
Ma Hui
-----------------------------------------------------------------------------------------------------------------------
Note: If this post answers your question, please click the Correct Answer button. Thank you!
-----------------------------------------------------------------------------------------------------------------------