All Example MCAL S32K312 DS3.5 RTD-3.0.0

[#1]

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* Test HW: S32K3X4EVB-Q172
* MCU: S32K312
* Compiler: S32DS3.5
* SDK release: RTD 3.0.0
* Debugger: PE Micro
* Target: internal_FLASH
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Example MCAL S32K312 MEM_InFls  DS3.5 RTD300 :--
Example MCAL S32K312 MEM_InFls DS3.5 RTD300 - NXP Community

Example MCAL S32K312 FEE DS3.5 RTD300 :--
Example MCAL S32K312 FEE DS3.5 RTD300 - NXP Community

Example MCAL S32K312 FEE and MEM_InFls DS3.5 RTD300 :--
Example MCAL S32K312 FEE and MEM_InFls DS3.5 RTD300 - NXP Community

[Dinesh_Guleria]

Pe Micro use to delete the Dataflash, on every new FLashing of firmware, which corrupts the EEPROM data.

After making this changes in debug configuration it worked..