Hello,
I've now had 2 micros fail in the exact same flash sector without approaching the erase cycle limit. To be fair, I haven't kept track of how many erase cycles I've done, but It would definitely be between 100 to 200 flash erase cycles.
The flash sectors that fail are located at 0xFE000 and 0x1FE000.
I get a FPVIOL error when I try to erase these sectors.
It appears only the first 16 bytes are failing.
What might cause this? Is there a known mask issue? did I get unlucky twice?
Let me know if more information is required.
Any help is appreciated,
Thanks.
Eric
The issue appears to be related to the K65f180m "flash_demo" project for IAR IDE.
I've run the demo reconfigured for a K26 on our board.
In the demo, we erase a part of the upper pflash block (/w verification) ( 0xFE000 - 0x100000).
Later in the demo, we swap the flash blocks (0,1 -> 2,3).
In our application, erasing any of the first sixteen bytes of the 0xFE000 sector while the SWAP bit of FTFE_FCNFG register is SET causes the FPVIOL flag of the FTFE_FSTAT register to trigger.
I'm not going to put any more time into this as it does not effect our application when we do not run the demo application.
We also do not use the flash swap feature.
Thanks,
Eric
Turning on the 'swap' function TAKES OVER the indicated phrase in such block in EACH HALF of memory space. You are NO LONGER 'free' to erase/write any part of those phrases.
Hi Eric,
Thanks for your sharing,
And I was wondering if you can tell me the exactly chip number of K26 you use.
Have a great day,
Ping
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