i.MX6 DDR Stress Test Tool V2.70 calibration fails.

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i.MX6 DDR Stress Test Tool V2.70 calibration fails.

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pranavparmar
Contributor III

Hi LinWang‌,

We are working our custom board with iMX6 Quad processor. On trying the DDR3 calibration for 1GB with DDR Stress Tool V2.70 using GUI we are getting an error as: ERROR FOUND, we can't get suitable value !!!!

 

We have been working to resolve this for long time but unsuccessful.

 

thanks for the help in advance. The log is as below:

 

Density per chip select: 1024MB 
============================================

Current Temperature: 35
============================================

DDR Freq: 396 MHz

ddr_mr1=0x00000004
Start write leveling calibration...
running Write level HW calibration
Write leveling calibration completed, update the following registers in your initialization script
MMDC_MPWLDECTRL0 ch0 (0x021b080c) = 0x00150017
MMDC_MPWLDECTRL1 ch0 (0x021b0810) = 0x001F0016
MMDC_MPWLDECTRL0 ch1 (0x021b480c) = 0x00150023
MMDC_MPWLDECTRL1 ch1 (0x021b4810) = 0x00080011
Write DQS delay result:
Write DQS0 delay: 23/256 CK
Write DQS1 delay: 21/256 CK
Write DQS2 delay: 22/256 CK
Write DQS3 delay: 31/256 CK
Write DQS4 delay: 35/256 CK
Write DQS5 delay: 21/256 CK
Write DQS6 delay: 17/256 CK
Write DQS7 delay: 8/256 CK

Starting DQS gating calibration
. HC_DEL=0x00000000 result[00]=0x11011111
. HC_DEL=0x00000001 result[01]=0x11011111
. HC_DEL=0x00000002 result[02]=0x01000010
. HC_DEL=0x00000003 result[03]=0x01000010
. HC_DEL=0x00000004 result[04]=0x11111111
. HC_DEL=0x00000005 result[05]=0x11111111
. HC_DEL=0x00000006 result[06]=0x11111111
. HC_DEL=0x00000007 result[07]=0x11111111
. HC_DEL=0x00000008 result[08]=0x11111111
. HC_DEL=0x00000009 result[09]=0x11111111
. HC_DEL=0x0000000A result[0A]=0x11111111
. HC_DEL=0x0000000B result[0B]=0x11111111
. HC_DEL=0x0000000C result[0C]=0x11111111
. HC_DEL=0x0000000D result[0D]=0x11111111
ERROR FOUND, we can't get suitable value !!!!
dram test fails for all values.

Error: failed during ddr calibration

It seems from your suggestion that calibration has failed at byte 1 and byte 6.

Can you please suggest any specific issue in the board? And how did you decode the issue is with byte 1 and byte 6?

I also request you to suggest the solution if any.

Thanks and Regards,

Pranav

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1 Solution
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LinWang
NXP Employee
NXP Employee

Hi Pranav,

Please consider Yuri's comments.

Seems you miss one question below.

1. How many boards see this issue?

If you can guarantee design is fine, then we will focus on soldering and DDR device.

In order to reduce effort, let's check low 16bit only.

Suggestions:

1.  change a new DDR chip on lowest 16bit.

And using Scritp aid and generate 16 bit script for debug.

https://community.nxp.com/docs/DOC-94917

2. change DDR chip from another vendor.

View solution in original post

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pranavparmar
Contributor III

Problem solved. I have configured a wrong uart.

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LinWang
NXP Employee
NXP Employee

It is also works well.

Please contact SW expert for your boot issue.

I believe DDR HW related factors had been excluded.

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pranavparmar
Contributor III

Hi @linwang

The calibration test is successful also stress test is successful. But u-boot is not booting. Please guide if there is any suggestion.

Below is the attached calibration report:


============================================
DDR Stress Test (2.6.0) 
Build: Aug 1 2017, 17:33:25
NXP Semiconductors.
============================================

============================================
Chip ID
CHIP ID = i.MX6 Dual/Quad (0x63)
Internal Revision = TO1.2
============================================

============================================
Boot Configuration
SRC_SBMR1(0x020d8004) = 0x00000000
SRC_SBMR2(0x020d801c) = 0x20000001
============================================

ARM Clock set to 1GHz

============================================
DDR configuration
BOOT_CFG3[5-4]: 0x00, Single DDR channel.
DDR type is DDR3 
Data width: 64, bank num: 8
Row size: 14, col size: 10
Chip select CSD0 is used 
Density per chip select: 1024MB 
============================================

Current Temperature: 35
============================================

DDR Freq: 396 MHz

ddr_mr1=0x00000004
Start write leveling calibration...
running Write level HW calibration
Write leveling calibration completed, update the following registers in your initialization script
MMDC_MPWLDECTRL0 ch0 (0x021b080c) = 0x000F0017
MMDC_MPWLDECTRL1 ch0 (0x021b0810) = 0x00180011
MMDC_MPWLDECTRL0 ch1 (0x021b480c) = 0x00100023
MMDC_MPWLDECTRL1 ch1 (0x021b4810) = 0x000B0014
Write DQS delay result:
Write DQS0 delay: 23/256 CK
Write DQS1 delay: 15/256 CK
Write DQS2 delay: 17/256 CK
Write DQS3 delay: 24/256 CK
Write DQS4 delay: 35/256 CK
Write DQS5 delay: 16/256 CK
Write DQS6 delay: 20/256 CK
Write DQS7 delay: 11/256 CK

Starting DQS gating calibration
. HC_DEL=0x00000000 result[00]=0x11111111
. HC_DEL=0x00000001 result[01]=0x11101010
. HC_DEL=0x00000002 result[02]=0x00000000
. HC_DEL=0x00000003 result[03]=0x00000000
. HC_DEL=0x00000004 result[04]=0x11111111
. HC_DEL=0x00000005 result[05]=0x11111111
. HC_DEL=0x00000006 result[06]=0x11111111
. HC_DEL=0x00000007 result[07]=0x11111111
. HC_DEL=0x00000008 result[08]=0x11111111
. HC_DEL=0x00000009 result[09]=0x11111111
. HC_DEL=0x0000000A result[0A]=0x11111111
. HC_DEL=0x0000000B result[0B]=0x11111111
. HC_DEL=0x0000000C result[0C]=0x11111111
. HC_DEL=0x0000000D result[0D]=0x11111111
DQS HC delay value low1 = 0x02010201, high1=0x03030303
DQS HC delay value low2 = 0x02020201, high2=0x03030303

loop ABS offset to get HW_DG_LOW
. ABS_OFFSET=0x00000000 result[00]=0x11111011
. ABS_OFFSET=0x00000004 result[01]=0x11111111
. ABS_OFFSET=0x00000008 result[02]=0x11111111
. ABS_OFFSET=0x0000000C result[03]=0x10111011
. ABS_OFFSET=0x00000010 result[04]=0x10100010
. ABS_OFFSET=0x00000014 result[05]=0x10110011
. ABS_OFFSET=0x00000018 result[06]=0x10110011
. ABS_OFFSET=0x0000001C result[07]=0x00110010
. ABS_OFFSET=0x00000020 result[08]=0x00100010
. ABS_OFFSET=0x00000024 result[09]=0x00000000
. ABS_OFFSET=0x00000028 result[0A]=0x00000000
. ABS_OFFSET=0x0000002C result[0B]=0x00000000
. ABS_OFFSET=0x00000030 result[0C]=0x00000000
. ABS_OFFSET=0x00000034 result[0D]=0x00000000
. ABS_OFFSET=0x00000038 result[0E]=0x00000000
. ABS_OFFSET=0x0000003C result[0F]=0x00000000
. ABS_OFFSET=0x00000040 result[10]=0x00000000
. ABS_OFFSET=0x00000044 result[11]=0x00000000
. ABS_OFFSET=0x00000048 result[12]=0x00000000
. ABS_OFFSET=0x0000004C result[13]=0x00000000
. ABS_OFFSET=0x00000050 result[14]=0x00000000
. ABS_OFFSET=0x00000054 result[15]=0x00000000
. ABS_OFFSET=0x00000058 result[16]=0x00000000
. ABS_OFFSET=0x0000005C result[17]=0x00000000
. ABS_OFFSET=0x00000060 result[18]=0x00000000
. ABS_OFFSET=0x00000064 result[19]=0x00000000
. ABS_OFFSET=0x00000068 result[1A]=0x00000000
. ABS_OFFSET=0x0000006C result[1B]=0x00000000
. ABS_OFFSET=0x00000070 result[1C]=0x00000000
. ABS_OFFSET=0x00000074 result[1D]=0x00000000
. ABS_OFFSET=0x00000078 result[1E]=0x00000000
. ABS_OFFSET=0x0000007C result[1F]=0x00000000

loop ABS offset to get HW_DG_HIGH
. ABS_OFFSET=0x00000000 result[00]=0x00000000
. ABS_OFFSET=0x00000004 result[01]=0x00000000
. ABS_OFFSET=0x00000008 result[02]=0x00000000
. ABS_OFFSET=0x0000000C result[03]=0x00000000
. ABS_OFFSET=0x00000010 result[04]=0x00000000
. ABS_OFFSET=0x00000014 result[05]=0x00000000
. ABS_OFFSET=0x00000018 result[06]=0x00000000
. ABS_OFFSET=0x0000001C result[07]=0x00000000
. ABS_OFFSET=0x00000020 result[08]=0x00000000
. ABS_OFFSET=0x00000024 result[09]=0x00000000
. ABS_OFFSET=0x00000028 result[0A]=0x00000000
. ABS_OFFSET=0x0000002C result[0B]=0x00000000
. ABS_OFFSET=0x00000030 result[0C]=0x01000000
. ABS_OFFSET=0x00000034 result[0D]=0x01000000
. ABS_OFFSET=0x00000038 result[0E]=0x01000000
. ABS_OFFSET=0x0000003C result[0F]=0x01000000
. ABS_OFFSET=0x00000040 result[10]=0x01000000
. ABS_OFFSET=0x00000044 result[11]=0x01000100
. ABS_OFFSET=0x00000048 result[12]=0x11001100
. ABS_OFFSET=0x0000004C result[13]=0x11001110
. ABS_OFFSET=0x00000050 result[14]=0x11101110
. ABS_OFFSET=0x00000054 result[15]=0x11101111
. ABS_OFFSET=0x00000058 result[16]=0x11101111
. ABS_OFFSET=0x0000005C result[17]=0x11111111
. ABS_OFFSET=0x00000060 result[18]=0x11111111
. ABS_OFFSET=0x00000064 result[19]=0x11111111
. ABS_OFFSET=0x00000068 result[1A]=0x11111111
. ABS_OFFSET=0x0000006C result[1B]=0x11111111
. ABS_OFFSET=0x00000070 result[1C]=0x11111111
. ABS_OFFSET=0x00000074 result[1D]=0x11111111
. ABS_OFFSET=0x00000078 result[1E]=0x11111111
. ABS_OFFSET=0x0000007C result[1F]=0x11111111


BYTE 0: 
Start: HC=0x00 ABS=0x1C
End: HC=0x03 ABS=0x50
Mean: HC=0x01 ABS=0x75
End-0.5*tCK: HC=0x02 ABS=0x50
Final: HC=0x02 ABS=0x50
BYTE 1: 
Start: HC=0x01 ABS=0x24
End: HC=0x03 ABS=0x48
Mean: HC=0x02 ABS=0x36
End-0.5*tCK: HC=0x02 ABS=0x48
Final: HC=0x02 ABS=0x48
BYTE 2: 
Start: HC=0x00 ABS=0x0C
End: HC=0x03 ABS=0x40
Mean: HC=0x01 ABS=0x65
End-0.5*tCK: HC=0x02 ABS=0x40
Final: HC=0x02 ABS=0x40
BYTE 3: 
Start: HC=0x01 ABS=0x10
End: HC=0x03 ABS=0x44
Mean: HC=0x02 ABS=0x2A
End-0.5*tCK: HC=0x02 ABS=0x44
Final: HC=0x02 ABS=0x44
BYTE 4: 
Start: HC=0x00 ABS=0x20
End: HC=0x03 ABS=0x58
Mean: HC=0x01 ABS=0x7B
End-0.5*tCK: HC=0x02 ABS=0x58
Final: HC=0x02 ABS=0x58
BYTE 5: 
Start: HC=0x01 ABS=0x24
End: HC=0x03 ABS=0x4C
Mean: HC=0x02 ABS=0x38
End-0.5*tCK: HC=0x02 ABS=0x4C
Final: HC=0x02 ABS=0x4C
BYTE 6: 
Start: HC=0x01 ABS=0x0C
End: HC=0x03 ABS=0x2C
Mean: HC=0x02 ABS=0x1C
End-0.5*tCK: HC=0x02 ABS=0x2C
Final: HC=0x02 ABS=0x2C
BYTE 7: 
Start: HC=0x01 ABS=0x1C
End: HC=0x03 ABS=0x44
Mean: HC=0x02 ABS=0x30
End-0.5*tCK: HC=0x02 ABS=0x44
Final: HC=0x02 ABS=0x44

DQS calibration MMDC0 MPDGCTRL0 = 0x42480250, MPDGCTRL1 = 0x02440240

DQS calibration MMDC1 MPDGCTRL0 = 0x424C0258, MPDGCTRL1 = 0x0244022C

Note: Array result[] holds the DRAM test result of each byte. 
0: test pass. 1: test fail 
4 bits respresent the result of 1 byte. 
result 00000001:byte 0 fail. 
result 00000011:byte 0, 1 fail.

Starting Read calibration...

ABS_OFFSET=0x00000000 result[00]=0x11111111
ABS_OFFSET=0x04040404 result[01]=0x11111111
ABS_OFFSET=0x08080808 result[02]=0x11011001
ABS_OFFSET=0x0C0C0C0C result[03]=0x01011000
ABS_OFFSET=0x10101010 result[04]=0x00011000
ABS_OFFSET=0x14141414 result[05]=0x00000000
ABS_OFFSET=0x18181818 result[06]=0x00000000
ABS_OFFSET=0x1C1C1C1C result[07]=0x00000000
ABS_OFFSET=0x20202020 result[08]=0x00000000
ABS_OFFSET=0x24242424 result[09]=0x00000000
ABS_OFFSET=0x28282828 result[0A]=0x00000000
ABS_OFFSET=0x2C2C2C2C result[0B]=0x00000000
ABS_OFFSET=0x30303030 result[0C]=0x00000000
ABS_OFFSET=0x34343434 result[0D]=0x00000000
ABS_OFFSET=0x38383838 result[0E]=0x00000000
ABS_OFFSET=0x3C3C3C3C result[0F]=0x00000000
ABS_OFFSET=0x40404040 result[10]=0x00000000
ABS_OFFSET=0x44444444 result[11]=0x00000000
ABS_OFFSET=0x48484848 result[12]=0x00000000
ABS_OFFSET=0x4C4C4C4C result[13]=0x00000000
ABS_OFFSET=0x50505050 result[14]=0x00000000
ABS_OFFSET=0x54545454 result[15]=0x00000000
ABS_OFFSET=0x58585858 result[16]=0x00000000
ABS_OFFSET=0x5C5C5C5C result[17]=0x00000000
ABS_OFFSET=0x60606060 result[18]=0x00100000
ABS_OFFSET=0x64646464 result[19]=0x00100100
ABS_OFFSET=0x68686868 result[1A]=0x11100111
ABS_OFFSET=0x6C6C6C6C result[1B]=0x11101111
ABS_OFFSET=0x70707070 result[1C]=0x11111111
ABS_OFFSET=0x74747474 result[1D]=0x11111111
ABS_OFFSET=0x78787878 result[1E]=0x11111111
ABS_OFFSET=0x7C7C7C7C result[1F]=0x11111111

Byte 0: (0x0c - 0x64), middle value:0x38
Byte 1: (0x08 - 0x64), middle value:0x36
Byte 2: (0x08 - 0x60), middle value:0x34
Byte 3: (0x14 - 0x68), middle value:0x3e
Byte 4: (0x14 - 0x6c), middle value:0x40
Byte 5: (0x08 - 0x5c), middle value:0x32
Byte 6: (0x10 - 0x64), middle value:0x3a
Byte 7: (0x0c - 0x64), middle value:0x38

MMDC0 MPRDDLCTL = 0x3E343638, MMDC1 MPRDDLCTL = 0x383A3240

Starting Write calibration...

ABS_OFFSET=0x00000000 result[00]=0x10111111
ABS_OFFSET=0x04040404 result[01]=0x10111111
ABS_OFFSET=0x08080808 result[02]=0x10110110
ABS_OFFSET=0x0C0C0C0C result[03]=0x10100010
ABS_OFFSET=0x10101010 result[04]=0x10100010
ABS_OFFSET=0x14141414 result[05]=0x00000000
ABS_OFFSET=0x18181818 result[06]=0x00000000
ABS_OFFSET=0x1C1C1C1C result[07]=0x00000000
ABS_OFFSET=0x20202020 result[08]=0x00000000
ABS_OFFSET=0x24242424 result[09]=0x00000000
ABS_OFFSET=0x28282828 result[0A]=0x00000000
ABS_OFFSET=0x2C2C2C2C result[0B]=0x00000000
ABS_OFFSET=0x30303030 result[0C]=0x00000000
ABS_OFFSET=0x34343434 result[0D]=0x00000000
ABS_OFFSET=0x38383838 result[0E]=0x00000000
ABS_OFFSET=0x3C3C3C3C result[0F]=0x00000000
ABS_OFFSET=0x40404040 result[10]=0x00000000
ABS_OFFSET=0x44444444 result[11]=0x00000000
ABS_OFFSET=0x48484848 result[12]=0x00000000
ABS_OFFSET=0x4C4C4C4C result[13]=0x00000000
ABS_OFFSET=0x50505050 result[14]=0x00000000
ABS_OFFSET=0x54545454 result[15]=0x00000000
ABS_OFFSET=0x58585858 result[16]=0x00000000
ABS_OFFSET=0x5C5C5C5C result[17]=0x00000000
ABS_OFFSET=0x60606060 result[18]=0x00000000
ABS_OFFSET=0x64646464 result[19]=0x00000000
ABS_OFFSET=0x68686868 result[1A]=0x01000000
ABS_OFFSET=0x6C6C6C6C result[1B]=0x01000000
ABS_OFFSET=0x70707070 result[1C]=0x01001100
ABS_OFFSET=0x74747474 result[1D]=0x01001100
ABS_OFFSET=0x78787878 result[1E]=0x11011111
ABS_OFFSET=0x7C7C7C7C result[1F]=0x11111111

Byte 0: (0x08 - 0x74), middle value:0x3e
Byte 1: (0x14 - 0x74), middle value:0x44

(0x0c - 0x74), middle value:0x40Byte 5: (0x14 - 0x78), middle value:0x46
Byte 6: (0x00 - 0x64), middle value:0x32
Byte 7: (0x14 - 0x74), middle value:0x44

MMDC0 MPWRDLCTL = 0x3A3C443E,MMDC1 MPWRDLCTL = 0x44324640


MMDC registers updated from calibration

Write leveling calibration
MMDC_MPWLDECTRL0 ch0 (0x021b080c) = 0x000F0017
MMDC_MPWLDECTRL1 ch0 (0x021b0810) = 0x00180011
MMDC_MPWLDECTRL0 ch1 (0x021b480c) = 0x00100023
MMDC_MPWLDECTRL1 ch1 (0x021b4810) = 0x000B0014

Read DQS Gating calibration
MPDGCTRL0 PHY0 (0x021b083c) = 0x42480250
MPDGCTRL1 PHY0 (0x021b0840) = 0x02440240
MPDGCTRL0 PHY1 (0x021b483c) = 0x424C0258
MPDGCTRL1 PHY1 (0x021b4840) = 0x0244022C

Read calibration
MPRDDLCTL PHY0 (0x021b0848) = 0x3E343638
MPRDDLCTL PHY1 (0x021b4848) = 0x383A3240

Write calibration
MPWRDLCTL PHY0 (0x021b0850) = 0x3A3C443E
MPWRDLCTL PHY1 (0x021b4850) = 0x44324640


Success: DDR calibration completed!!!

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LinWang
NXP Employee
NXP Employee

The calibration looks fine.

What about stress test by this tool?

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pranavparmar
Contributor III

Hi LinWang

Below is the result of stress test result:


============================================
DDR Stress Test (2.6.0)
Build: Aug 1 2017, 17:33:25
NXP Semiconductors.
============================================

============================================
Chip ID
CHIP ID = i.MX6 Dual/Quad (0x63)
Internal Revision = TO1.2
============================================

============================================
Boot Configuration
SRC_SBMR1(0x020d8004) = 0x00000000
SRC_SBMR2(0x020d801c) = 0x20000001
============================================

ARM Clock set to 1GHz

============================================
DDR configuration
BOOT_CFG3[5-4]: 0x00, Single DDR channel.
DDR type is DDR3
Data width: 64, bank num: 8
Row size: 14, col size: 10
Chip select CSD0 is used
Density per chip select: 1024MB
============================================


DDR Stress Test Iteration 1
Current Temperature: 40
============================================

DDR Freq: 396 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Freq: 413 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Freq: 432 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Freq: 452 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Freq: 475 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Freq: 500 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test


Success: DDR Stress test completed!!!

But still my u-boot is not booting. I am getting jump to address message, but there are no messages on the console. any suggestions?

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LinWang
NXP Employee
NXP Employee

3.jpg

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pranavparmar
Contributor III

Hi LinWang‌,

I understand that termination won't help for the delay. I have configured MMDC0_MDMISC = 0x000117C0 to compensate the delay. But still byte 1 is not successful.

Is there any other way to rectify the issue?

Thank you in advance.

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LinWang
NXP Employee
NXP Employee

Hi Pranav,

Two suggestions for lowest 16 bit bus:

1. Do SI siumlation to check your PCB layout.

2. Do compliance test and see if there are some SI issue.

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pranavparmar
Contributor III

Hi LinWang

In the Stress Test Tool for my iMX6DQ board minimum frequency that I can set is 300MHz. Also I tried with 528MHz. The result are as follows:

DDR Freq: 528 MHz

ddr_mr1=0x00000004
Start write leveling calibration...
running Write level HW calibration
Write leveling calibration completed, update the following registers in your initialization script
MMDC_MPWLDECTRL0 ch0 (0x021b080c) = 0x0029002D
MMDC_MPWLDECTRL1 ch0 (0x021b0810) = 0x00360029
MMDC_MPWLDECTRL0 ch1 (0x021b480c) = 0x0026003A
MMDC_MPWLDECTRL1 ch1 (0x021b4810) = 0x00170024
Write DQS delay result:
Write DQS0 delay: 45/256 CK
Write DQS1 delay: 41/256 CK
Write DQS2 delay: 41/256 CK
Write DQS3 delay: 54/256 CK
Write DQS4 delay: 58/256 CK
Write DQS5 delay: 38/256 CK
Write DQS6 delay: 36/256 CK
Write DQS7 delay: 23/256 CK

Starting DQS gating calibration
. HC_DEL=0x00000000 result[00]=0x11111111
. HC_DEL=0x00000001 result[01]=0x11011111
. HC_DEL=0x00000002 result[02]=0x10010011
. HC_DEL=0x00000003 result[03]=0x00000010
. HC_DEL=0x00000004 result[04]=0x00000010
. HC_DEL=0x00000005 result[05]=0x11111111
. HC_DEL=0x00000006 result[06]=0x11111111
. HC_DEL=0x00000007 result[07]=0x11111111
. HC_DEL=0x00000008 result[08]=0x11111111
. HC_DEL=0x00000009 result[09]=0x11111111
. HC_DEL=0x0000000A result[0A]=0x11111111
. HC_DEL=0x0000000B result[0B]=0x11111111
. HC_DEL=0x0000000C result[0C]=0x11111111
. HC_DEL=0x0000000D result[0D]=0x11111111
ERROR FOUND, we can't get suitable value !!!!
dram test fails for all values.

Error: failed during ddr calibration

Also I have attached images of my Design checklist Layout details. I see many issues with address and command lengths so I have used a termination IC with 50 ohms pullup for it. I wish you could highlight most critical ones that may cause the issue.

Thanks,

Pranav

1.png

3.png

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LinWang
NXP Employee
NXP Employee

Hi Pranav,

Please consider Yuri's comments.

Seems you miss one question below.

1. How many boards see this issue?

If you can guarantee design is fine, then we will focus on soldering and DDR device.

In order to reduce effort, let's check low 16bit only.

Suggestions:

1.  change a new DDR chip on lowest 16bit.

And using Scritp aid and generate 16 bit script for debug.

https://community.nxp.com/docs/DOC-94917

2. change DDR chip from another vendor.

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pranavparmar
Contributor III

Hi LinWang‌,

I tested the new card and calibration got succeeded. It was the BGA soldering issue.

But still the processor is not booting the u-boot. Loading the u-boot is successful but I am not getting any data on uart-0.

Any suggestions?

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LinWang
NXP Employee
NXP Employee

Please addached calibration report for reference.

What about DDR test at working frequency?

3,435 Views
pranavparmar
Contributor III

HI LinWang‌,

Currently I am working with only one board. In my Design I had a provision for Termination Regulator for DDR. Scince my clock signal length is 2559.61 mils (> 2250) I populated the Regulator with 50 ohms pull-up to VTT. Now I am getting the following result:

============================================
DDR configuration
BOOT_CFG3[5-4]: 0x00, Single DDR channel.
DDR type is DDR3
Data width: 64, bank num: 8
Row size: 14, col size: 10
Chip select CSD0 is used
Density per chip select: 1024MB
============================================

Current Temperature: 32
============================================

DDR Freq: 297 MHz

ddr_mr1=0x00000004
Start write leveling calibration...
running Write level HW calibration
Write leveling calibration completed, update the following registers in your initialization script
MMDC_MPWLDECTRL0 ch0 (0x021b080c) = 0x00110012
MMDC_MPWLDECTRL1 ch0 (0x021b0810) = 0x00170010
MMDC_MPWLDECTRL0 ch1 (0x021b480c) = 0x0010001B
MMDC_MPWLDECTRL1 ch1 (0x021b4810) = 0x00070010
Write DQS delay result:
Write DQS0 delay: 18/256 CK
Write DQS1 delay: 17/256 CK
Write DQS2 delay: 16/256 CK
Write DQS3 delay: 23/256 CK
Write DQS4 delay: 27/256 CK
Write DQS5 delay: 16/256 CK
Write DQS6 delay: 16/256 CK
Write DQS7 delay: 7/256 CK

Starting DQS gating calibration
. HC_DEL=0x00000000 result[00]=0x11011111
. HC_DEL=0x00000001 result[01]=0x00000010
. HC_DEL=0x00000002 result[02]=0x00000010
. HC_DEL=0x00000003 result[03]=0x00000010
. HC_DEL=0x00000004 result[04]=0x11111111
. HC_DEL=0x00000005 result[05]=0x11111111
. HC_DEL=0x00000006 result[06]=0x11111111
. HC_DEL=0x00000007 result[07]=0x11111111
. HC_DEL=0x00000008 result[08]=0x11111111
. HC_DEL=0x00000009 result[09]=0x11111111
. HC_DEL=0x0000000A result[0A]=0x11111111
. HC_DEL=0x0000000B result[0B]=0x11111111
. HC_DEL=0x0000000C result[0C]=0x11111111
. HC_DEL=0x0000000D result[0D]=0x11111111
ERROR FOUND, we can't get suitable value !!!!
dram test fails for all values.

Error: failed during ddr calibration

Also there is one more query. I am trying to access the DDR memory from Read/Write part in the tool. I am able to write and Read the address space properly. Following is the log for the same.

addr=0x10000000,data=0x12345678

 

Success to write address 0x10000000

addr=0x10000004,data=0x1234ABCD

 

Success to write address 0x10000004

 

                                0x0                         0x4                         0x8                         0xC

                                ----------------------------------------------------------------------------------------------------------------

0x10000000:       0x12345678        

memory read is done

 

                                0x0                         0x4                         0x8                         0xC

                                ----------------------------------------------------------------------------------------------------------------

0x10000004:       0x1234ABCD      

memory read is done

addr=0x10000008,data=0xFFFF0F0F

 

Success to write address 0x10000008

addr=0x1000000C,data=0x05050F0F

 

Success to write address 0x1000000c

 

                                0x0                         0x4                         0x8                         0xC

                                ----------------------------------------------------------------------------------------------------------------

0x10000008:       0xFFFF0F0F        

memory read is done

 

                                0x0                         0x4                         0x8                         0xC

                                ----------------------------------------------------------------------------------------------------------------

0x1000000C:       0x05050F0F        

memory read is done

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LinWang
NXP Employee
NXP Employee

3.jpg

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Yuri
NXP Employee
NXP Employee

Hello,

  the following may be helpful:

https://community.nxp.com/thread/350446 

Regards,

Yuri.

3,435 Views
LinWang
NXP Employee
NXP Employee

Hi Pranav,

According follwing log, "0" means calibration pass, "1" means fail.

Lower bit start from byte0, so byte1 and byte6 can't pass DQS gating calibration.

. HC_DEL=0x00000001 result[01]=0x11011111
. HC_DEL=0x00000002 result[02]=0x01000010
. HC_DEL=0x00000003 result[03]=0x01000010
. HC_DEL=0x00000004 result[04]=0x11111111

Please check these two byte in your design.

Need more info to analysis the issue.

1. How many boards see this issue?

2. Is this the design reviewed by NXP?

3. Comapre with reference design what's the changes? Both schmatic and layout.

4. What's the DDR part number?

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pranavparmar
Contributor III

Hi LinWang,

My design is similar to SABER Lite Board.

As per this reference there is no change in the schematic and design uses T-topology for DDR routing.

My DDR part number is AS4C128M16D3-12BAN.

And my design has not been reviewed by NXP.

Also please suggest if there is any solution to resolve Byte 1 and Byte 6 issue.

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