Functional Safety featured event: CTI ISO 26262 conference

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Functional Safety featured event: CTI ISO 26262 conference

NXP Employee
NXP Employee

Our Advanced Automotive Analog (AAA) Functional Safety Manager r40959‌ will speak about the new challenges for hardware semiconductor SEooC with ISO 26262:2018 and system expectation next September 30th, 2019 in Stuttgart, Germany at the 11th International annual CTI ISO 26262 conference.

Valérie will discuss the major impacts of the 2nd edition of the ISO 26262:2018 standard for the hardware Safety Element out of Context (SEooC) semiconductor development, the confirmation measures and safety analysis for hardware semiconductor element. She is also covering the new challenge for hardware architectural metrics when providing multi hardware semiconductor parts for system integration.

The 11th International annual CTI ISO 26262 conference allows to exchange experiences with ISO 26262 2nd edition and find out current developments on SOTIF, Security and Automated Driving to mitigate your risks by making your own assessment of ISO 26262. By attending, you will be able to expand your own functional safety network and maintain and deepen existing business contacts, also find out the strengths and weaknesses of your current ISO 26262 policies. Share the voice and support Valérie session!

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