Detectability of broken pins

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Detectability of broken pins

241件の閲覧回数
hirokado
Contributor III

Hello Support team,

I have some questions about S32K142 from the viewpoint of functional safety.

[Questions]
1.
The VDDA pin fails and becomes open, is it possible to detect the failure?

2.
The VREFH pin fails and becomes open, is it possible to detect the failure?

3.
The VREFL pin fails and becomes open, is it possible to detect the failure?

4.
The VDD or VSS pin fails and becomes open, is it possible to detect the failure?

Best regards,
Hiroyuki Kadowaki

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230件の閲覧回数
Yashwant_Singh
NXP Employee
NXP Employee

Hi Hiroyuki,

 

We have LVDs present on Core, Clock and NVM supplies and for VDDA, VREFH and VDD we have an assumption in place (SM_204) which assumes that the ADCs are used to monitor the bandgap reference voltage of the PMC and to monitor the internal supplies connected to ADCs. You may refer the safety manual and the reference manual for more details. The following internal voltages are monitored on ADC0 Ch21:

Yashwant_Singh_0-1670997680380.png

 

 

In this way any loss of supply due to pin failure can be detected.

 

Let us know if you have any follow up questions.

 

Thanks!

-Yashwant

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