s32k3 Simulated_OEM_PROD in lifecycle?

[victory]

Hi NXP,

   i want test secure debug on S32K312,and hope not to advanced to OEM_PROD before finish whole development.

   i am now in CUST_DEL and ADKP programed.

i see some doc metioned "Simulated_OEM_PROD" but it's not described in detail.  my question is:

1. is it now available in HSE 2.40.0?

2. precondition to set it? currently i only set ADKP(raw mode) and use hse service to set, but failed with aa55a21c.

3. if set it done,  is it sufficient to test secure debug? 

4. in Simulated_OEM_PROD, after chip reset, what's LC now?  is it can fully back to CUST_DEL?

[VaneB]

Hi @victory 

1. is it now available in HSE 2.40.0? Yes.

2. precondition to set it? currently i only set ADKP(raw mode) and use hse service to set, but failed with aa55a21c. You can find more information in the HSE Service API Reference Manual. 

3. if set it done,  is it sufficient to test secure debug? Could you specify what you are looking to test?

4. in Simulated_OEM_PROD, after chip reset, what's LC now?  is it can fully back to CUST_DEL? Yes, after a reset the MCU returns to CUST_DEL.

BR, VaneB

[victory]

3. if set it done, is it sufficient to test secure debug? Could you specify what you are looking to test?
>> i want test enable secure debug using a jlink adapter to control sdaap , enable debug funciton, verify my script calcuation is correct.

[VaneB · Accepted solution]

Hi @victory 

The application scenario of “HSE_LC_SIMULATED_OEM_PROD” and “HSE_LC_SIMULATED_IN_FIELD” feature is to test the behavior difference of some HSE services under different LC (CUST_DEL, OEM_PROD, IN_FIELD), but does not want to carry out irreversible advancement (UTEST OTP), and this simulated advancement can be reverted to UTEST value after a system reset.

For example, when the LC has been advanced to SIMULATED_IN_FIELD, the service ERASE_NVM_DATA is restricted, which can only be executed in CUST_DEL LC stage.