AnsweredAssumed Answered

i.MX8M lpddr4 stress test failed at 1600MHz

Question asked by Ken Zhang on Dec 19, 2018
Latest reply on Jan 14, 2019 by Carlos Ramos

Hi there,

 

We are using 16Gb LPDDR4 (speed 3200, x16, 2 Channel, 2 CS) on our custom i.MX8M board.  If we were to set "Clock Cycle Freq" in the "MX8M_LPDDR4_register_programming_aid_EVK_preliminiary_v17 " excel sheet to 800MHz, stress test will pass.  However, Stress test failed if "Clock Cycle Freq" were set to 1600MHz.   Does anyone has similar problem?  

 

1600MHz stress test result:

 

============ Step 3: DDR parameters processing... ============
[Result] Done

Success: DDR Calibration completed!!!
DDR Stress Test Iteration 1
Actual DDR Clock rate being tested:
- DRC controller0: 800MHz, -DDR0 PHY: 1600MHz
--------------------------------
--Running DDR test on region 1--
--------------------------------

t0.1: data is addr test
....
t0.2: row hop read test
...

t1: memcpy SSN armv8_x32 test
.Address of test1 failure: 0x0000000080740000
Data was: 0xFFFFC0000000FFFE
But pattern was: 0xFFFFFFFF00000001
Source is wrong, it is: 0xFFFF225500000001
Address of source failure:0x0000000040740000

*****************************************************************************************************

 

800Mhz stress test result:

 

============ Step 3: DDR parameters processing... ============
[Result] Done

Success: DDR Calibration completed!!!
DDR Stress Test Iteration 1
Actual DDR Clock rate being tested:
- DRC controller0: 400MHz, -DDR0 PHY: 800MHz
--------------------------------
--Running DDR test on region 1--
--------------------------------

t0.1: data is addr test
....
t0.2: row hop read test
...

t1: memcpy SSN armv8_x32 test
....
t2: byte-wise SSN armv8_x32 test
..
t3: memcpy pseudo random pattern test
....................................................................
t4: IRAM_to_DDRv1 test
...

t5: IRAM_to_DDRv2 test

Success: DDR Stress test completed!!!

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