Dear NXP friends
The CLKOUT pin shorts to VDD pin after power on,it is an permanent damage, causing an 5mA VDD supply current.
The abnormal resistance value between Pin CLKOUT and VDD pin is about 5ohm to 50ohm.
But IIC interface is still operational.
The probalility of failure is about 1%.
We can't figure out the conditions whereby the device failed.
Looking forward to your reply,thanks.
The circuit schematic design will be uploaded soon.
from the picture,we can see the CLKOUT pin is float,this pin only connect to a test point.
Dear NXP friends
Our distributor said that NXP QFE rejected our request, because they thought it is an obvious EIPD incident, and NXP do not accept EIPD failed component.
They add, generally speaking, NXP only provides I/V curve report, and de-cap analysis is not performed.
And now test intruments in NXP Shenzhen have been taken back to Europe for maintenance.
Could you help us for further analysis?
Dear Jinyum,
I am afraid I cannot assist you with further analysis as our online support team does not have suitable equipment for that.
Best regards,
Tomas
Dear NXP friends
Is there any other way to help us to analyze the problem?
Dear Jinyum,
I have not heard of other customers with such a problem.
Are you using a solder joint inspection machine or any other form of inspection to make sure there is no solder bridge between pins #9 and #10?
Best regards,
Tomas
There is no solder bridge between pins #9 and #10.
After removing from the PCB and cleaning the DFN bottom pin pad, the resistance value between pin9 and pin10 is still 5ohm to 50ohm.
I have collected almost 100 failed samples.
Dear Jinyum,
In such a case, I would recommend you to contact your distributor you bought the devices from and ask him to initialize a CQI for a failure analysis in our lab.
Best regards,
Tomas
Dear NXP friends
Thanks for your support, we will contact our distributor to initialize a CQI.