A requirement of the standard is to detect the accumulation of latent defects. To meet this requirement the MPC5744P has the ability to execute Built-In Self-Test (BIST) procedures.
We have read the above BIST Application Note and the MPC5744P Safety and Reference Manuals, and our understanding is that the off-line BIST (MBIST and LBIST) is per default enabled and if any fault is detected the HW ensures that MCU stops executing (stays in reset).
Can you please confirm that our understanding is correct?
Also, is there any way to verify this (e.g. inspecting UTEST flash area or injecting any fault to be detected by the off-line BIST)?
Yes, your understanding is correct.
For injecting the fault to BIST you can play with voltage during tests for example.
PS: if you have any questions create separate thread.
This one is intended only for issue found in my document.