how to trigger these events
F_VOR_FUNC - Can be triggered by violation of supply voltages defined in datasheet. Have in mind that you must configure PMC module REE and RES registers to trigger this reset as functional / destructive.
Another remark. If you configure PMC RES/REE via DCF records as destructive, they cannot be changed from user application.
F_TSR_FUNC - Violation of operating temperatures defined in Datasheet. Heat or cool the micro in climatic chamber.
F_JTAG_FUNC - The EXTEST, HIGHZ, and CLAMP instructions cause a JTAG 'functional' reset event to occur, which setsthis field to 1. Use these JTAG instruction to trigger this reset.
F_FCCU_SOFT - via FCCU. Configure FCCU reaction on any fault as short functional reset.
F_FCCU_HARD - via FCCU. Configure FCCU reaction on any fault as long functional reset.
F_SOFT_FUNC - via ME module. Do mode transition to mode target mode 0x0. ((triggers a ‘functional’ reset event)
F_ST_DONE - Internal flag for self-test done. It is triggered automatically after build in self-test.
F_EXR - via external reset pin / debugger external reset.
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