i.MX6 Dual core & DDR3 1G

[Phil_liu]

HI NXP partner,

Our customer is encountering issues with memtester when running the application with 750MB of memory. Even when reduced to 730MB, errors persist. 

So, 

1. Did we have standard value or  reference values for memtester ? 

2.Can we get some clues from error message, becasue, our cusotmer suspects a potential RAM damage issue , so we want to determine how to evaluate if the  RAM is indeed faulty. 

Board info: 

CPU: i.MX6 Dual core

RAM : DDR3 1G

root@imx6qrom3420a1:~# memtester 750M 1
memtester version 4.3.0 (32-bit)
Copyright (C) 2001-2012 Charles Cazabon.
Licensed under the GNU General Public License version 2 (only).

pagesize is 4096
pagesizemask is 0xfffff000
want 750MB (786432000 bytes)
got 750MB (786432000 bytes), trying mlock ...locked.
Loop 1/1:
Stuck Address : testing 0FAILURE: possible bad address line at offset 0x2225ed8c.
Skipping to next test...
Random Value : FAILURE: 0xb7abde66 != 0xb7a9de66 at offset 0x0a51f588.
FAILURE: 0xc91276dd != 0xc91076dd at offset 0x0a51f588.
Compare XOR : FAILURE: 0x1b3d4520 != 0x1b3b4520 at offset 0x0a51f588.
FAILURE: 0x66371e7d != 0x66351e7d at offset 0x0ab0f588.
Compare SUB : FAILURE: 0xd0b47840 != 0x8cd07840 at offset 0x0a51f588.
FAILURE: 0x5e0bef2a != 0x1a27ef2a at offset 0x0ab0f588.
Compare MUL : Compare DIV : ok
Compare OR : ok
Compare AND : ok
Sequential Increment: ok
Solid Bits : testing 2FAILURE: 0xffffffff != 0xfffdffff at offset 0 x0ab1f588.
Block Sequential : testing 2FAILURE: 0x02020202 != 0x02000202 at offset 0 x0a5bf588.
FAILURE: 0x02020202 != 0x02000202 at offset 0x0a74f588.
FAILURE: 0x02020202 != 0x02000202 at offset 0x0b34f588.
FAILURE: 0x02020202 != 0x02000202 at offset 0x0b81f588.
FAILURE: 0x02020202 != 0x02000202 at offset 0x0b85f588.
Checkerboard : testing 11FAILURE: 0xaaaaaaaa != 0xaaa8aaaa at offset 0 x0ac7f588.
Bit Spread : testing 15FAILURE: 0x00028000 != 0x00008000 at offset 0 x0aa8f588.
Bit Flip : testing 8FAILURE: 0xfffffffd != 0xfffdfffd at offset 0 x0ab1f588.
Walking Ones : ok
Walking Zeroes : testing 17FAILURE: 0x00020000 != 0x00000000 at offset 0 x0afff588.
FAILURE: 0x00020000 != 0x00000000 at offset 0x0b19f588.

Done.
root@imx6qrom3420a1:~#

[Rita_Wang]

1. Did we have standard value or reference values for memtester ?

No, Within 1GB is OK for your design.

2.Can we get some clues from error message, becasue, our cusotmer suspects a potential RAM damage issue , so we want to determine how to evaluate if the RAM is indeed faulty.

No, here you need to make sure if other application are running when you do the memtester. You can tell us.

3. Do we have other tools that can confirm whether the RAM is indeed faulty?

From your above information can not sure if is the RAM is faulty

[Phil_liu]

HI @Rita_Wang 

I ran the DDR Stress Test and still received a failure message. From your experience, do you know where the problem might be? Are there other tools we can use to analyze and identify where the issue could be occurring?

============================================
DDR Stress Test (3.0.0)
Build: Dec 14 2018, 14:12:06
NXP Semiconductors.
============================================

============================================
Chip ID
CHIP ID = i.MX6 Dual/Quad (0x63)
Internal Revision = TO1.2
============================================

============================================
Boot Configuration
SRC_SBMR1(0x020d8004) = 0x0c002850
SRC_SBMR2(0x020d801c) = 0x22000001
============================================

ARM Clock set to 1GHz

============================================
DDR configuration
BOOT_CFG3[5-4]: 0x00, Single DDR channel.
DDR type is DDR3
Data width: 64, bank num: 8
Row size: 14, col size: 10
Chip select CSD0 is used
Density per chip select: 1024MB
============================================

DDR Stress Test Iteration 1
Current Temperature: 49
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 2
Current Temperature: 57
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 3
Current Temperature: 59
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 4
Current Temperature: 60
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 5
Current Temperature: 61
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 6
Current Temperature: 61
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 7
Current Temperature: 61
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 8
Current Temperature: 62
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 9
Current Temperature: 62
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 10
Current Temperature: 62
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 11
Current Temperature: 62
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

DDR Stress Test Iteration 12
Current Temperature: 62
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
Address of failure(step2): 0x4e669d8c
Data was: 0x4e649d8c
But pattern should match address
Error: failed to run stress test!!!