DDR Stress Test (t0.1: data is addr test) Failed

[masatsuguyamada]

Hi,
We are using i.MX6 (MCIMX6Q7CVT08AC) on custom board, and the i.MX6 accesses to micron DDR3 DRAM (mt41k256m16ha).

We tried DDR Stress Test v1.0.3 on this environment,

******************************
DDR Stress Test (1.0.3) for MX6DQ
Build: Sep 18 2014, 11:11:44
Freescale Semiconductor, Inc.
******************************

the test was failed at "t0.1: data is addr test".

-----------------------------------
loop: 543
DDR Freq: 528 MHz
t0.1: data is addr test
Address of failure: 0x103f07b0
Data was: 0x003f07b0
But pattern should match address
-----------------------------------

All boards we have produced were failed at the same test item in 2~3 days (loop 450~650). Also all fail was caused by same symptom, some bit "1" was flipped to "0". So we have tried latest Stress test,

https://community.nxp.com/docs/DOC-105652
ddr_stress_tester_uboot_v2.60.zip

but it was not failed for over 4 days.

My question is, why there is a difference between new test and old test, especially from test algorithm point of view.
We are currently concerned about Row Hammer possibility, after this Stress Test. If there is vulnerability in our system, we'd like to resolve the problem.

Thanks in advance,
Yamada

[masatsuguyamada]

Thanks for the advice, I have created the case (Case 00110441).

Regards,
Yamada

[b36401]

I see Igor suggested you to post this question on community.
If you do not get the information there please reopen case 00110441 and I will ask the developers team.

Have a great day,
Victor

[masatsuguyamada]

Thank you for help, although I posted to Stress Test v2.60 community,
currently no information.　So I would like to ask to developers team.

The Symptom seemed Row Hammer, I'd like to know whether there is difference such as access frequency to the same address.

Regards,
Yamada

[b36401]

We need to ask the developers what may be the difference.

Please create a technical case:
https://community.nxp.com/thread/381898

Have a great day,
Victor

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