******************************************************************************** * Detailed Description: * Application performs basic initialization, setup PLL to maximum allowed freq., * initializes interrupts, blinking one LED by interrupt, second LED by software * loop, initializes and display notice via UART terminal and then terminal ECHO. * The example configures the device for maximum performance (OPTIMIZATIONS_ON). * For XPC567XKIT516 it initializes EBI for mounted external SRAM device. * * ------------------------------------------------------------------------------ * Test HW:         XPC567XKIT516 - MPC5674ADAT516 Rev.C, MPC567XEVBFXMB Rev.B * MCU:             PPC5674FMVYA264 * Terminal:        19200-8-no parity-1 stop bit-no flow control on eSCI_A * Fsys:            264/200/150/60 MHz * Debugger:        Lauterbach Trace32 *                  PeMicro USB-ML-PPCNEXUS * Target:          RAM, internal_FLASH * EVB connection:  ETPUC0(J24-0) -> USER_LED_8 (J5-8) *                  ETPUC1(J24-1) -> USER_LED_7 (J5-7)(to see blinking LEDs) * ********************************************************************************

******************************************************************************** * Detailed Description: * This example shows how to reprogram the shadow flash. * * It is highly recommended to read application note "Preventing Device Lockout * via Censorship on MPC55xx and MPC563x Families" * http://www.freescale.com/files/32bit/doc/app_note/AN3787.pdf * * This examples erases the shadow flash, then it restores censorship information * and then NVUSRO nonvolatile register is reprogrammed to disable the watchdog. * The watchdog is disabled by clearing of bit WATCHDOG_EN in NVUSRO. It ensures * that watchdog is disabled automatically during startup of MCU. * Watchdog can be also disabled by software (shown in the code). * * It is important to execute the code from RAM memory because Read-While-Write * is not supported here. * * ------------------------------------------------------------------------------ * Test HW:  XPC56xxMB2 + XPC560B 144LQFP, SPC5604B, silicon mask set 2M27V * Target :  internal_FLASH, RAM * ********************************************************************************

The aim of the MPC5643L PWM triggered measurement concept is to introduce hardware  subsystem concept of autonomous triggering of ADC measurement by PWM module in desired time intervals and automatic storing of measured data into buffer located in SRAM. This autonomous measurement concept will offload the microprocessor’s core and presents the very precise way how to achieve the ADC time critical measurement synchronized with PWM signal generated by FlexPWM module.

This is simple example of the usage of Flash Array Integrity Check (FAIC) function that is available on all MPC56xx devices.   The FAIC reads data from selected and unlocked flash blocks and calculates the MISR signature. User can compare the MISR signature calculated by flash controller (in runtime) with MISR calculated by offline tool (this is done during development, not in runtime) from s-record file. If the MISR is identical, we know that the content of selected flash blocks corresponds to content in s-record file and that there are no ECC errors (single bit or double bit ECC errors).

This demo performs a communication on LIN bus between two MPC5604B EVBs.   LinFlex0 LIN Master ******************************************************************************** * Detailed Description: * - send header from a LIN Master * - either receive data from a LIN Slave or transmit a data * - no interrupt is used, just SW pooling * * ------------------------------------------------------------------------------ * Test HW:  XPC560B 144 LQFP MINIMODULE, XPC56XX EVB MOTHERBOARD, SPC5604B 2M27V * Target :  internal_RAM, Flash * LinFlex0: Lin Master, 19200 baudrate * Fsys:     64 MHz PLL with 8 MHz crystal reference * * ------------------------------------------------------------------------------ * EVB connections and jumper configuration * * XPC56XX EVB MOTHERBOARD * for LinFlex0 connection to the MC33661 LIN transceiver: * - RXDA_SEL (near SCI !!!!) jumper over pins 1-2 * - TXDA_SEL (near SCI) jumper over 1-2 * * for LIN Master functionality * - VSUP (J6) jumper fitted *   lin xceiver will get +12V from the EVB * - V_BUS (J14) jumper not fitted * - MASTER_EN jumper fitted * - LIN_EN jumper fitted * ********************************************************************************     LinFlex0 LIN Slave ******************************************************************************** * Detailed Description: * - receive header from a LIN Master * - either receive data from a LIN Master or transmit a data * - Filter can be enabled with the FILT_EN = 1 * - If filter is enabled TX interrupt is used to prepare data to send and *    RX interrupt to read received data * - If filter is disabled SW polling is used * * ------------------------------------------------------------------------------ * Test HW:  XPC560B 144 LQFP MINIMODULE, XPC56XX EVB MOTHERBOARD, SPC5604B 2M27V * Target :  internal_RAM * LinFlex0: Lin Slave, 19200 baudrate * Fsys:     64 MHz PLL with 8 MHz crystal reference * * ------------------------------------------------------------------------------ * EVB connections and jumper configuration * * XPC56XX EVB MOTHERBOARD * for LinFlex0 connection to the MC33661 LIN transceiver: * - RXDA_SEL (near SCI !!!!) jumper over pins 1-2 * - TXDA_SEL (near SCI) jumper over pins 1-2 * * for LIN Slave functionality * - VSUP (J6) jumper not fitted ...LIN transceiver will get +12V from the Master * - V_BUS jumper not fitted * - MASTER_EN jumper not fitted * - LIN_EN jumper fitted * ********************************************************************************

******************************************************************************** * Detailed Description: * ECSM Error Generation Register EEGR is used to generate a non-correctable ECC * error in RAM. The bad data is accessed then, so the IVOR1 exception is * generated and handled. * This file shows also ECSM_combined_isr and how to correct the wrong data. * Use macro Induce_ECC_error_by_DMA_read to select whether ECC error will be * injected by DMA read or CPU read. * At the end of main file you can select particular ME/EE setup by * comment/uncomment of particular function calls. * * ------------------------------------------------------------------------------ * Test HW:        XPC563MKIT * MCU:            PPC5633MMLQ80 * Fsys:           80/60/40/12 MHz * Debugger:       Lauterbach Trace32 *                 PeMicro USB-ML-PPCNEXUS * Target:         RAM, internal_FLASH * Terminal:       19200-8-no parity-1 stop bit-no flow control on eSCI_A * EVB connection: default * ********************************************************************************

******************************************************************************** * Detailed Description: * Purpose of the example is to show how to generate Multi bit ECC error in * internal SRAM or FLASH (user must choose it in the option at the end of main * function) and how to handle this error with respect to constraints given by * MPC5643L architecture (ECSM/RGM/FCCU relation and ECC error handling through * reset). The example is only possible to run in internal_FLASH target. Power- * -on-reset is required after downloading the code into MCU's flash. The example * displays notices in the terminal window (setting specified below). No other * external connection is required. * ------------------------------------------------------------------------------ * Test HW:         xPC564xLKIT, PPC5643L Cut3 silicon * Target :         internal_FLASH * Fsys:            120 MHz PLL0 * Debugger:        Lauterbach Trace32 *                  PeMicro USB-ML-PPCNEXUS * Terminal:        19200-8-no parity-1 stop bit-no flow control via LINFlex0 * EVB connection:  default * ********************************************************************************

******************************************************************************** * Detailed Description: * Application performs basic initialization, setup PLL to maximum allowed freq., * initializes interrupts, blinking one LED by interrupt, third LED by software * loop, initializes and display notice via UART terminal and then terminal ECHO. * Second core is started and second LED blinking is being performed by it. * The example configures the device for maximum performance (OPTIMIZATIONS_ON) * by initialization of instruction cache and enabling of branch prediction. * Example suppose MCU is configured for DPM (Decoupled-parallel mode). * Its intention is to offer advanced startup code additional to CW stationery. * * ------------------------------------------------------------------------------ * Test HW:         xPC564xLKIT, PPC5643L Cut3 silicon * Target :         internal_FLASH, RAM * Fsys:            120 MHz PLL0 * Debugger:        Lauterbach Trace32 *                  PeMicro USB-ML-PPCNEXUS * Terminal:        19200-8-no parity-1 stop bit-no flow control via LINFlex0 * EVB connection:  default * ********************************************************************************

******************************************************************************** * Detailed Description: * Application performs basic initialization, setup PLL to maximum allowed freq., * initializes interrupts, blinking one LED by interrupt, second LED by software * loop, initializes and display notice via UART terminal and then terminal ECHO. * * ------------------------------------------------------------------------------ * Test HW:        XPC563MKIT * MCU:            PPC5633MMLQ80 * Fsys:           80/60/40/12 MHz * Debugger:       Lauterbach Trace32 *                 PeMicro USB-ML-PPCNEXUS * Target:         RAM, internal_FLASH * Terminal:       19200-8-no parity-1 stop bit-no flow control on eSCI_A * EVB connection: default * ********************************************************************************

******************************************************************************** * Detailed Description: * Example show simple flash programming routine. During runtime it changes * content of field of constants 'test' (thus located in internal flash). * Also it shows how to relocate code into RAM a data into FLASH (used linker * command file is MPC5643L_my_sections.lcf and MPC5643L_DEBUG_my_sections.lcf). * * Note: For complex tasks use SSD driver (Freescale site for particular device, * Software&Tools/Run-Time Software/Middleware-Device Drivers * * ------------------------------------------------------------------------------ * Test HW:         xPC564xLKIT, PPC5643L Cut3 silicon * Target :         internal_FLASH, RAM * Fsys:            120 MHz PLL0 * Debugger:        Lauterbach Trace32 *                  PeMicro USB-ML-PPCNEXUS * Terminal:        19200-8-no parity-1 stop bit-no flow control via LINFlex0 * EVB connection:  default * ********************************************************************************

******************************************************************************** * Detailed Description: * Initializes eQADC module, performs calibration and converts channel 146 * (voltage level of VDD) to check core voltage level and displays it into * terminal window. No external connection required excluding terminal via eSCI. * * ------------------------------------------------------------------------------ * Test HW:        XPC564AKIT208S and XPC564AKIT324S * MCU:            SPC5644AMMG1,0M14X and SPC5644AMVZ1,0M14X * Fsys:           150/132/120/12 MHz * Debugger:       Lauterbach Trace32 *                 PeMicro USB-ML-PPCNEXUS * Target:         RAM, internal_FLASH * Terminal:       19200-8-no parity-1 stop bit-no flow control on eSCI_A * EVB connection: default * ********************************************************************************

******************************************************************************** * Detailed Description: * Enable external interrupt on pin PA[3]. * If falling edge is detected, interrupt is triggered and LED1 on PE[4] is * toggled. * * Connect external signal to PA[3] or connect push button by wire. * * ------------------------------------------------------------------------------ * Test HW:  TRK-MPC5606B, SPC5606B 0N32E * Target :  internal_FLASH, RAM * Fsys:     64 MHz PLL with 8 MHz crystal reference * ********************************************************************************

External Bus Interface FAQs related to MPC55xx and MPC56xx MCUs Preliminary version

******************************************************************************** * Detailed Description: * Example demostrates MCU behaviour when single bit RAM ECC error occurs by * intentional ECC error injection. * * ------------------------------------------------------------------------------ * Test HW:         xPC564xLKIT, PPC5643L Cut3 silicon * Target :         internal_FLASH * Fsys:            120 MHz PLL0 * Debugger:        Lauterbach Trace32 *                  PeMicro USB-ML-PPCNEXUS * Terminal:        19200-8-no parity-1 stop bit-no flow control via LINFlex0 * EVB connection:  default * ********************************************************************************

******************************************************************************** * Detailed Description: * Application performs basic initialization, setup PLL to maximum allowed freq., * initializes and display notice via UART terminal and then terminal ECHO. It * calculates temperature using TSENS0 and TSENS1 and prints it to the terminal. * * ------------------------------------------------------------------------------ * Test HW:         xPC564xLKIT, PPC5643L Cut3 silicon * Target :         internal_FLASH, RAM * Fsys:            120 MHz PLL0 * Debugger:        Lauterbach Trace32 *                  PeMicro USB-ML-PPCNEXUS * Terminal:        19200-8-no parity-1 stop bit-no flow control via LINFlex0 * EVB connection:  default * ********************************************************************************

******************************************************************************** * Detailed Description: * Application performs basic initialization, setup PLL to maximum allowed freq., * initializes interrupts, blinking one LED by interrupt, second LED by software * loop, initializes and display notice via UART terminal and then terminal ECHO. * The example configures the device for maximum performance (OPTIMIZATIONS_ON) * by initialization of instruction cache and enabling of branch prediction. * Example suppose MCU is configured for LSM (Lock-step mode). * Its intention is to offer advanced startup code additional to CW stationery. * * ------------------------------------------------------------------------------ * Test HW:         xPC564xLKIT, PPC5643L Cut3 silicon * Target :         internal_FLASH, RAM * Fsys:            120 MHz PLL0 * Debugger:        Lauterbach Trace32 *                  PeMicro USB-ML-PPCNEXUS * Terminal:        19200-8-no parity-1 stop bit-no flow control via LINFlex0 * EVB connection:  default * ********************************************************************************

This example enters the MCU into STANDBY0 low power mode and wakes up to backup SRAM. The WKPU6 (PE[0]pin) is used to wake up the MCU.   Regards, Petr   ******************************************************************************** * Detailed Description: * * On the EVB use KEY2 to enter Standby. * Use KEY1 to wake up from Standby to a code in backup SRAM. * * In RUN mode the LED1 blinks very fast, second core toggels LED3 * In STANDBY all LEDs are off. * The wakeup code blinks LED1 and LED2 slowly. * * The macro WKP_CORE is used to select which core is used after MCU wakes up. * When z4 core is selected, it is also necessary to set the MMU otherwise exception * is generated when uncovered memory area is accessed. * This is not needed for z0 core due to lack of the MMU.  * * * ------------------------------------------------------------------------------ * Test HW:  XPC56xxMB2 + XPC564xB/C, SPC5646C 0N32E silicon * Target :  internal_FLASH * Fsys:     120 MHz PLL0 ********************************************************************************

******************************************************************************** * Detailed Description: * Application performs basic initialization, setup PLL to maximum allowed freq., * initializes interrupts, blinking one LED by interrupt, second LED by software * loop, initializes and display notice via UART terminal and then terminal ECHO. * The example configures the device for maximum performance (OPTIMIZATIONS_ON). * IT INITIALIZES EBI FOR EXTERNAL SRAM CONNECTED TO XPC564AKIT324S AND TEST IT. * * ------------------------------------------------------------------------------ * Test HW:        XPC564AKIT324S * MCU:            SPC5644AMVZ1 0M14X QAK1235G * Fsys:           150/132/120/12 MHz * Debugger:       Lauterbach Trace32 * Target:         RAM, internal_FLASH * Terminal:       19200-8-no parity-1 stop bit-no flow control on eSCI_A * EVB connection: default * ********************************************************************************

******************************************************************************** * Detailed Description: * Application performs basic initialization, setup PLL to maximum allowed freq., * initializes interrupts, blinking one LED by interrupt, second LED by software * loop, initializes and display notice via UART terminal and then terminal ECHO. * The example configures the device for maximum performance (OPTIMIZATIONS_ON). * For XPC564AKIT324S it initializes EBI for mounted external SRAM. * Its intention is to offer advanced startup code additional to CW stationery. * ------------------------------------------------------------------------------ * Test HW:        XPC564AKIT208S and XPC564AKIT324S * MCU:            SPC5644AMMG1,0M14X and SPC5644AMVZ1,0M14X * Fsys:           150/132/120/12 MHz * Debugger:       Lauterbach Trace32 *                 PeMicro USB-ML-PPCNEXUS * Target:         RAM, internal_FLASH * Terminal:       19200-8-no parity-1 stop bit-no flow control on eSCI_A * EVB connection: default * ********************************************************************************   NOTE: It cannot be used with MPC5642A device, only with MPC5644A and MPC5643A !   For MPC5642A device, use following project instead of attached one: Example XPC5642AKIT PinToggleStationery CW10.6

******************************************************************************** * Detailed Description: * This example shows how to configure Wake up unit and CAN sampler. * Once the device is woken up from STOP mode by falling edge on CAN0RX pin, * the CAN sampler starts to sample this pin in given period. * FlexCAN module is not initialized and used in this example because the CAN * sampler is independent of FlexCAN. * ------------------------------------------------------------------------------ * Test HW:  XPC56xxMB2 + XPC560B 176LQFP, PPC5607B * Target :  internal_FLASH, RAM * Fsys:     64 MHz PLL * ********************************************************************************