S32K148 ADC test value unstable

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S32K148 ADC test value unstable

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shaun_yue
Contributor I

Hi Community,

When using Example"adc_swtrigger_s32k148" project to use ADC module collect the target value ,  found that the test value was unstable. The test results are shown in the figure, which is the same for all three circuits tested.

Test environment: 3.3V supply voltage, target sampling voltage is 3V

 

Please give some advice

 

shaun_yue_0-1711328380328.png

 

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danielmartynek
NXP TechSupport
NXP TechSupport

Hi @shaun_yue,

Please try using either a longer sample time or reduce the ADC frequency or use a low-resistance input source.

The ADC must be calibrated.

 

Thank you,

BR, Daniel

 

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shaun_yue
Contributor I

Daniel,

Thank you for  prompt reply. I'll try the advice you gave me. 

About the placement of calibration functions (ADC_DRV_AutoCalibration),whether the function is placed in front of the "while(1)"  or in the "while(1)"  ,which one is placed correctly. 

shaun_yue_0-1711508017391.png

shaun_yue_2-1711508055100.png

 

 

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danielmartynek
NXP TechSupport
NXP TechSupport

Hi @shaun_yue,

AN12217 S32K1xx ADC guidelines, spec and configuration

3. Best practices to increase accuracy

https://www.nxp.com/docs/en/application-note/AN12217.pdf

 

Regards,

Daniel

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shaun_yue
Contributor I

Thank you for help

last question,  I change the "useroffset"&"usergain" , and the result no change. And how to use the function ADC_DRV_ConfigUserCalibration . 

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