When I test ddr, calibration fail, the configure like below attached 1.png , the fail information is:
Byte 0: (0x 8 - 0x70), middle value:0x3C
Byte 1: (0x C - 0x74), middle value:0x40
ERROR FOUND, we can't get suitable value !!!!
dram test fails for all values.
Error: failed during ddr calibration
the init script is : S32V234_DDR3.inc.
Please give me some advice on the ddr stress issue, Thanks!
Your issue can require a lot of additional information from your side, like sw setup, schematics details etc. Public community is not convenient place for such discussions/investigations.
Please create a technical Case, if you want to get help from NXP.