our design info : i.MX8MQ with LPDDR4 3GB(Micron 6Gb-die * 4). and we want to change the LPDDR4 3GB(Micron 6Gb-die * 4) device to LPDDR4 2GB(Micron 8Gb-die *2) device. but when i use the DDR stress test tool to verify our new board with new 2GB LPDDR4 device, i get the failed training result.
coz , on our new-designed PCB , the channel A has different PCB layout with channel B, we suspect that the failed training result maybe related to our new PCB layout .
so , we want to know how to identify which channel(ch_a or ch_b) failed, while the LPDDR4 PHY training failed.