AnsweredAssumed Answered

DDR Stress test fails on IMX7S

Question asked by James Jamesson on Mar 18, 2020
Latest reply on Mar 19, 2020 by igorpadykov

Hi, NXP Community,

 

I am having problems with executing DDR stress test on my custom board hosting an IMX7S and the Micron MT52L256M32D1PF LPDDR3. I have managed to configure the DDR enough to run U-boot and Linux kernel correctly without any problems so far, but the DDR stress tests just fail.

 

I have tried the GUI version on Windows and the U-boot/JTag versions on Linux. Moreover, they fail at different places. On the GUI version, the test simply fails. On the U-Boot/Jtag version, the test just freezes after a certain point (see log below).

 

I have tried changing the DDR frequencies, chip density, and played around with different settings but the results are pretty much similar. Also, manually writing to and reading from memory works.

 

Maybe someone has an idea to why this happens?

 

Thank you in advance,

 

James

--------------------------------------------------------------------------------------------------------------------------

 

I have attached the logs for both the GUI DDR stress test and U-Boot stress test results below.

GUI:


============================================
DDR Stress Test (3.0.0)
Build: Dec 14 2018, 14:13:33
NXP Semiconductors.
============================================

 

============================================
Chip ID
CHIP ID = i.MX7 Dual (0x72)
Internal Revision = TO1.3
============================================

 

============================================
Boot Configuration
SRC_SBMR1(0x30390058) = 0x00002800
SRC_SBMR2(0x30390070) = 0x09000001
============================================

 


============================================
DDR configuration
DDR type is LPDDR3
Data width: 32, bank num: 8
Row size: 15, col size: 10
One chip select is used
Density per chip select: 1024MB
Total density is 1024MB
============================================

 


DDR Stress Test Iteration 1
DDR Freq: 300 MHz
t0.1: data is addr test
Address of failure(step2): 0x80000000
Data was: 0x8006c000
But pattern should match address
Error: failed to run stress test!!!

 


U-Boot:

=> go 0x00910000
## Starting application at 0x00910000 ...

============================================
DDR Stress Test (3.0.0)
Build: Dec 14 2018, 14:21:26
NXP Semiconductors.
============================================

============================================
Chip ID
CHIP ID = i.MX7 Dual
Internal Lots = 0x30360800
============================================

============================================
Boot Configuration
SRC_SBMR1(0x30390058) = 0x00002800
SRC_SBMR2(0x30390070) = 0x0a000001
============================================

What ARM core speed would you like to run?
Type 1 for 800MHz, 2 for 1GHz
ARM Clock set to 1GHz

============================================
DDR configuration
DDR type is LPDDR3
Data width: 32, bank num: 8
Row size: 15, col size: 10
One chip select is used
Density per chip select: 1024MB
Total density is 1024MB
============================================

Please select the DDR density per CHANNEL (in bytes) on the board
Type 0 for 2GB; 1 for 1GB; 2 for 512MB; 3 for 256MB; 4 for 128MB; 5 for 64MB; 6 for 32MB
Note, if there are two chip selects per channel, then input the combined density of
both chip selects per channel

 

>>> System freezes here after this!

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