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LPC84x FlashROM Data retention

Question asked by jun yamada on May 13, 2019
Latest reply on Jun 11, 2019 by jun yamada



1. Is the flash ROM of the LPC84x NOR type?

2. Does this data retention period mean the life is calculated from the number of read errors that occur as a result of accelerated testing with the temperature turned on with the power on?

3. I think that the probability that the error of the flash ROM occurs in the power ON state changes with the temperature condition, for example, when the standard of Tamb = -40 ° C to +105 ° C is relaxed from -20 ° C to +70 ° C etc., the period is extended Is it?
I would be happy if you could tell me the formula.


# I do not think that English is not good.


Thank you.