1. Is the flash ROM of the LPC84x NOR type?
2. Does this data retention period mean the life is calculated from the number of read errors that occur as a result of accelerated testing with the temperature turned on with the power on?
3. I think that the probability that the error of the flash ROM occurs in the power ON state changes with the temperature condition, for example, when the standard of Tamb = -40 ° C to +105 ° C is relaxed from -20 ° C to +70 ° C etc., the period is extended Is it?
I would be happy if you could tell me the formula.
# I do not think that English is not good.