We are considering equipment with a product life of at least 15 years.
The CPU to be used is considered with LPC84x.
It is the data retention period of flash ROM,
The Kinetis series has a minimum of 20 years typ 100 years.
LPC84x is Min 10 years Typ 20 years.
So the question is
1. Test method complies with JEDEC NVM qualification.
What are the conditions?
2. If temperature conditions are relaxed, will there be a minimum of 20 years?