Hi
Our product use MPC5775K and FS6523. There is a boot failure when the ambient temperature below -25℃。
The initiation process stop at the while loop of FCCU_init() :
FCCU_init() while(FCCU.CTRL.B.OPS != 0x3)
I tried to clear all NCF before config FCCU, but NCF[4] can't be cleared, and SSCM_STATUS.CERS is set and can't be clear by writing '1'.
When ambient temperature goes above -25℃, there is no such issue.
Hi,
you wont be able to clear this NCF[4] until the SSCM is still reporting it via CERS bit.
MEMORY_DCF_SAFETY_ERR - Indication of fault during timing/repair configuration initialization by SSCM of different memories. Faults can be caused by parity or triple-redundant errors in loaded configuration data.
In other words, you have a mismatch in safety DCF client you have programmed into UTEST flash memory.
Please make sure your safety DCF clients are correct or use our calculator:
https://community.nxp.com/docs/DOC-335523
Peter
MPC5744P,fccu,after FCCU_DRV_Init,inject ncf[0], PMC->FIR = 0x4U,when debug this line,Error : Error in ONCE status register during instruction execution. why?
Hi Peter,
We didn't change the default DCF configuration, nor add any DCF records.
When ambient temperature goes above -25℃, there is no such fault. I guess the fault is caused by parity or triple-redundant errors when loading configuration data, but I don't know why it occurs only when temperature is under -25℃.
Hi,
Do you see this behavior on all samples or on just one?
Do you have your custom board or NXP evaluation board?
Peter
Hi Peter,
We tested 10 samples, and 4 samples have this behavior. We have evaluation board of MPC5775K.
hmm,
Could you share with me dump of your UTEST flash.
Because NCF4 is called on CERS set in SSCM. I would like to check user area of UTEST. There is no other possibility to trigger this fault except CERS bit.
Which cut of device are you using? 0N76P?
Peter