I am attempting to calibrate an i.MX7D with 2GB RAM consisting of 2x 8gb DDR RAM chips of Samsung
P/N: K4B8G1646D-MYK0. The chip internal configuration is a dual die configuration with CS0 and CS1.
1. I am using the "MX7D_DDR3_register_programming_aid_v1_2" spread sheet with following parameters:
|Memory part number:||K4B8G1646D-MYK0|
|Density of each DRAM device (Gb):||8|
|Number of DRAM devices per chip select||2|
|Density per chip select (Gb)1:||8|
|Number of Chip Selects used2||2|
|Total DRAM density (Gb)||16|
|Number of ROW Addresses2||15|
|Number of COLUMN Addresses2||10|
|Number of BANK addresses2||3|
|Number of BANKS2||8|
|Bus Width: 32 or 16 (bits)||32|
|Clock Cycle Freq (MHz)3||533|
|Clock Cycle Time (ns)||1.876|
Note: the number of ROW addresses in the chip pinout table is 15. I assume this is since it is a dual die chip in which each die is 4gb
2. I am using v2.80 DDR Test Tool.
DDR Density is set to 1GB since setting to 2GB prints an error:
"Error, selected density is higher than what is supported!
Modify and Re-download again!!!"
Setting to 1GB i can see the following print:
DDR type is DDR3
Data width: 32, bank num: 8
Row size: 15, col size: 10
Two chip selects are used
Density per chip select: 1024MB
Total density is 2048MB
3. I then run calibration at 528Mhz.
Read calibration starts but then fails with the error: Error: failed during ddr calibration
Are DRAMs with 2 Chip selects configuration supported by the i.MX7D and the test tool?
Are there any errors in the above settings?
Thanks for your help.