I have an instrument cluster that uses the MC9S12XHZ256 MCU. The cluster gets a "Failed Self test" message on it's LCD Odometer display when the ignition voltage is applied.I can verify the MCU is the failure by swapping in a known good one. In the "bad" MCU, all of the odometer information has been erased. Other than that , the cluster performs normally. Because of this, I'm thinking that it's an EEPROM issue as opposed to a Flash memory issue.If this is correct, can the EEPROM in the failed MCU be reprogrammed? Does NXP have a programmer that supports this device? Thanks.