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iMX6 stress tester v2.70 stress test fails

Question asked by PRANAV PARMAR on Nov 29, 2017
Latest reply on Dec 12, 2017 by PRANAV PARMAR

Hi LinWang,

 

As discussed in the calibration failure post i.MX6 DDR Stress Test Tool V2.70 calibration fails. I tried running the stress test. I got the following results:

 

============================================
DDR Stress Test (2.6.0)
Build: Aug 1 2017, 17:33:25
NXP Semiconductors.
============================================

============================================
Chip ID
CHIP ID = i.MX6 Dual/Quad (0x63)
Internal Revision = TO1.2
============================================

============================================
Boot Configuration
SRC_SBMR1(0x020d8004) = 0x00000000
SRC_SBMR2(0x020d801c) = 0x21000001
============================================

ARM Clock set to 1GHz

============================================
DDR configuration
BOOT_CFG3[5-4]: 0x00, Single DDR channel.
DDR type is DDR3
Data width: 64, bank num: 8
Row size: 14, col size: 10
Chip select CSD0 is used
Density per chip select: 1024MB
============================================


DDR Stress Test Iteration 1
Current Temperature: 40
============================================

DDR Freq: 0 MHz
t0.1: data is addr test
Address of failure(step2): 0x10002000
Data was: 0x10000000
But pattern should match address
Error: failed to run stress test!!!

 

Reading the 32 bytes from address 0x10000000

 

Here as per the test result the data should be 0x10000000 which is same written at the address 0x10002000.

Can you please describe the failure reason at 0x10002000?

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