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IEC60730 RAM test and stack

Question asked by Pablo Igor Vicente on May 9, 2017
Latest reply on Feb 12, 2018 by Hui_Ma


Using the variable memory test functions IEC60730B_CM4_CM7_RAM_RuntimeTest() and  IEC60730B_CM4_CM7_RAM_AfterResetTest() provided by the core self-test library for Kinetis CM4 devices (IEC60730B_CM4_CM7_2.0), the stack can be inside the tested memory area?


And another question:

Can the tested memory area include part of upper RAM (address > 0x20000000) and part of lower RAM (address < 0x1FFFFFFF)?