AnsweredAssumed Answered

DRAM Calibration using DDR Stress Test Tool V2.60

Question asked by Kishor R on Mar 9, 2017
Latest reply on Mar 20, 2017 by Yuri Muhin

I am working DDR calibration using NXP DDR Test tool. We have imx6qp based custom hardware.

I am following the below procedure

 

1. Run NXP DDR test tool to get the calibrated values for the MMDC registers (12 registers)

2. Run the Calibration test multiple times and capture the results.

3. Based on the values in the multiple iterations, take the values which are mostly repeated

4. Update the script with the selected values

5. Run the DDR test tool, load the updated script and execute the stress test instead of calibration test

 

Most of the times the stress test fails and very few time it succeeds.

The overnight test fails all the times. 

I would like to know what is the best way to get the calibrated values.

If it is difficult to get optimised values for a single board, is it possible to get the optimisedregister values which run across the boards.

Appreciate any useful information that will help me to completed this process.

Below capture logs in fail and pass cases.

Thanks

Kishor

 

Failure case:

DDR Stress Test Iteration 1
Current Temperature: 40
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
test1 Address: 0x18695440
Data initally read was: 0x55555555
Data re-read is: 0x55555555
But pattern was: 0x5e5f95f8
Bit location: 0x0b0ac0ad
Error: failed to run stress test!!!

 

Success case:

 

DDR Stress Test Iteration 1
Current Temperature: 42
============================================

DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

Success: DDR Stress test completed!!!

Outcomes