I would like to ask about TEST_MODE input pin of i.MX7D.
In i.MX7 hardware development guide(IMX7DSHDG, Rev.0), it is mentioned as below.
“The TEST_MODE input is internally connected to an on-chip pulldown device. The user must tie this signal to GND.”
On the other hand, TEST_MODE pin is externally pulled-down through 100K ohm register on i.MX7-SABRE board.
Could you show me which is correct?
Actually, my customer made their own i.MX7D board. And they saw clock oscillation did not work when they add the 100K ohm pull-down register. And after removing the 100K ohm, the oscillation worked.