I am using the Keil uVision5 IDE with the ULINKpro Debug and Trace Adaptor connected to the MCB1700 Evaluation Board. (Target MCU is the NXP LPC1768)
It has been discovered that when in a debug session, analog to digital conversions are affected with additional noise.
This has been revealed by duplicating the ADC result to the DAC and scoping the output.
Does anyone have a solution/suggestion(s) in regards to the additional noise on ADC samples caused by JTAG/Trace during a debug session?
The NXP Application Note AN10974 mentions this problem without offering a solution - does this mean there is no solution?