LPC4357 is not entering Boundary Scan TEST mode

Discussion created by lpcware Employee on Jun 15, 2016
Content originally posted in LPCWare by teknik_kim on Wed Feb 05 08:21:31 MST 2014

I am trying to utilize the LPC4357's boundary scan TEST interface using the JTAG port of the processor, but the device doesn't seem to enter BS test mode(?)

I have pulled DBGEN low and connected the JTAG interface, including the /TRST pin.

Note: I can read the manufacturer ID correctly.

The interconnection test does not work, the LPC4357 does not change values on its pins during BS no matter what I try.

I have three BS devices on the PCB, each device is on a separate chain. They have been switched with no change in the result.

My BSDL file is a bit old - 2012-11-15. Is there a newer file? I could not locate other BSDL files on the NXP website.

Ideas are greatly appreciated!