We have got Freescale IMX6D processor board with which we are using LPDDR2 (32 bit). Now , we are running DDR Stess Tester which is happening till some time and then stucking at that point.
DDR Stress Test (1.0.3) for MX6DQ
Build: Jun 25 2014, 12:09:21
Freescale Semiconductor, Inc.
BOOT_CFG3[5-4]: 0x00, Single DDR channel.
DDR type is LPDDR2 in 1-channel mode.
Data width: 32, bank num: 8
Row size: 14, col size: 9
Chip select CSD0 is used
Density per chip select: 256MB
What ARM core speed would you like to run?
Type 0 for 650MHz, 1 for 800MHz, 2 for 1GHz, 3 for 1.2GHz
ARM set to 1.2GHz
Please select the DDR density per CHANNEL (in bytes) on the board
Type 0 for 2GB; 1 for 1GB; 2 for 512MB; 3 for 256MB; 4 for 128MB; 5 for 64MB; 6
Note, if there are two chip selects per channel, then input the combined densit
both chip selects per channel
DDR density selected (MB): 256
CHANNEL0 is selected.
Calibration will run at DDR frequency 528MHz. Type 'y' to continue.
If you want to run at other DDR frequency. Type 'n'
DDR Freq: 528 MHz
Would you like to run the read/write calibration? (y/n)
Note: Array result holds the DRAM test result of each byte.
0: test pass. 1: test fail
4 bits respresent the result of 1 byte.
result 0001:byte 0 fail.
result 0011:byte 0, 1 fail.
Starting Read calibration...
after this it is not progressing any more. We have waited for 1hr to 2hrs also.
I have some queries like:
1. Why is Density per chip select: 256MB ??? when we are using 2G LPDDR2 with single channel and Single Die and 1 chip select. Our LPDDR2 part number is MT42L64M32D1TK-18 IT:C from Micron Technology.
I have attached LPDDR2 Script aid which i have edited for our part number and Data sheet for LPDDR2 (MT42L64M32D1TK-18 IT:C)
Any help in this regard is appreciated