I ask to who knows or exprienced this problem.
I would like to confirm whether it is correct or not that i tried follows for success CV test.
This failure found at the application about Generic USB HID using 3 IN endpont, 3 OUT endpoint.
(Normal data TX/RX operation allways ok)
So, I had found following index values setting should be the root cause.
in the "USB_LDD.C" source generated by USB_LDD processor expert component
#define MAX_EP_IDX 0x0Cu modified to 0x0Du = EPcnt(this case 6) x2 +1
#define MAX_BD_IDX 0x19u modified to 0x1Bu = MAX_EP_IDX x 2 +1
When i appllied these change the test was passed.
Please comment about this issue.