I am trying to test memory corruption in the Flash module ECC of MC9S12G. I have the following questions on how the ECC works in here:
1. If we force a single bit or a double bit error through FCNFG register, how does it really test that the ECC works correctly when the actual bit errors occur?
I feel that it just set the flags for the interrupts to fire, Is my understanding correct?
2. How can i create/simulate single/double bit faults to test the ECC functionality?
Also, Is there any other way in MC9S12G micro to check for memory corruption(Flash area)?
Thanks in advance,