Falk Salewski

Built in Error Detection and Correction and/or Self Test available?

Discussion created by Falk Salewski on Feb 21, 2007
Latest reply on Feb 21, 2007 by Falk Salewski
Is there any information available if Error Detection and Correction Codes (EDCC/ECC) or Built in Self Test (BiST) are present in current freescale devices or if there are plans to include them?
I have the following measures in mind:
  • ECC for protection of code memory (can be done in software, but it would be nice to have it in hardware)
  • ECC for RAM and registers
  • Built in self test to monitor the CPU and built in peripherals (cyclic or at start up?)
  • ...

These measures might be of great interest in safety critical applications as future drive-by-wire systems.

Thanks for your help