Louis Ravina

EEPROM & Flash lifespans

Discussion created by Louis Ravina on Aug 21, 2006
Latest reply on Aug 22, 2006 by Alban Rampon
We are working on a new version of our instrument that will use a Freescale MC9S12DP512 MCU. In the Device User Guide, there is a table indicating that over the operating range of -40C to 125C, the NVM Reliability Characteristics, which we aren't sure if we're even interpreting correctly are:

Flash: Data Retention of 15 years if the memory is cycled 10 times.
EEPROM: Data Retention of 15 years if only cycled 10 times, dropping to 5 years if the EEPROM is cycled 10000 times.

Out instruments have had useful lives of 20-25 years, so a 15 year life is worrying. Further, we are saving use settings in EEPROM that can change daily, and a 5 year life there is even more of a problem. On the other hand, the instrument is used in a laboratory setting over comfortable room temperatures, not at the extremes of 125C and -40C. Is there more detailed information on this subject available somewhere?

Thanks.

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