Hi,
I have a custom board based on iMXRT1175 processor, it's an USB device board and hot-swap function is required. The problem is I found there is leakage voltage on processor IOs that drain by USB1_VBUS pin, it caused a pulse on processor IOs when hot-swap events happened, and the pulse can reach 1.3V/-0.5V when worst case. See records below.
My questions are: does these pulses/glitches on IOs when power up are acceptable (I guess no)? how to limit the leakage voltage from USB_VBUS PINs?
Record #1, my custom board. leakage voltage from USB1_VBUS (yellow trace) PIN to processor other IO (blue trace).

Record #2, NXP iMRT117x EVK board, leakage voltage from USB1_VBUS (yellow trace) PIN to processor other IO (blue trace).


Best Regards,
TC Liu