fail during Mfgtool download

[sethhorus]

Hi,

    I design a imx6q circuit board.

    I try firmware download by mfgtool,but stop "Jumping to OS Image".I can see uboot information and board stop "starting kernel......" in serial console.

    I use "DDR test tool V3" to stress test.

    Pass DDR Stress test.

    I really don't know whats wrong and need help.

[sethhorus]

 the board stop "starting kernel......" in serial console during download by mfgtool.

Boot from USB for mfgtools
Use default environment for mfgtools
Run bootcmd_mfg: run mfgtool_args;bootz ${loadaddr} ${initrd_addr} ${fdt_addr};
Hit any key to stop autoboot: 0
=> run bootcmd_mfg
Kernel image @ 0x12000000 [ 0x000000 - 0x53d8d0 ]
## Loading init Ramdisk from Legacy Image at 12c00000 ...
Image Name: fsl-image-mfgtool-initramfs-imx6
Image Type: ARM Linux RAMDisk Image (gzip compressed)
Data Size: 18729449 Bytes = 17.9 MiB
Load Address: 00000000
Entry Point: 00000000
Verifying Checksum ... OK
## Flattened Device Tree blob at 18000000
Booting using the fdt blob at 0x18000000
Using Device Tree in place at 18000000, end 1800d22d

Starting kernel ...

I burn other boards(different circuits and same DDR,PM）with same mfgtools.they are fine

[sethhorus]

THE DDR STRESS TEST IS FINE

enter desired START freq (135 to 672 MHz), then hit enter.
Note: DDR3 minimum is ~333MHz, do not recommend to go too much below this.
528
The freq you entered was: 528

Enter desired END freq (135 to 672 MHz), then hit enter.
Make sure this is equal to or greater than start freq
528
The freq you entered was: 528

Beginning stress test

loop: 1
DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

loop: 2
DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

loop: 3
DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

loop: 4
DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

loop: 5
DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

loop: 6
DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test

loop: 7
DDR Freq: 528 MHz
t0.1: data is addr test
t0: memcpy10 SSN x64 test
t1: memcpy8 SSN x64 test
t2: byte-wise SSN x64 test
t3: memcpy11 random pattern test
t4: IRAM_to_DDRv2 test
t5: IRAM_to_DDRv1 test
t6: read noise walking ones and zeros test