Hello,
In application note AN4466, it states that the following calibration sequences needs to be run when bring up a board.
• ZQ calibration
• Write leveling calibration
• DQS gating calibration
• Read data DQS calibration
• Write data DQS calibration
We have the DDR3 stress test tool and have applied it to our current i.MX53 design. When we run the calibration test we see that we get strobe, read, and write delays. The question we have is does the DDR stress test tool run the ZQ calibration and the write leveling when it runs the calibration routine or do we have to this separately?
If its not too late to ask a follow up a programmer here has asked: Are there code examples for the ZQ and write leveling test?
Thank you very much.
Hi J
i.MX53 ddr tester tool (below link) does not have calibration/leveling routines,
one needs to implement them separately
DDR_STRESS_TESTER_FOR_MX51_MX53 : DDR Stress tester kit
Best regards
igor
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