Dear All,
1) Could you please go through with the attached files of NXP calibration results ? Can you identify any problem with those calibrations ?
2) According to your experience what could be the reason for some boards are working and some are not in same production batch ?
Regards,
Peter.
Hi Peter
>1) Could you please go through with the attached files of NXP calibration results ?
>Can you identify any problem with those calibrations ?
both attached logs are fine showing that tests passed. One can try to rerun ddr test on
problematic boards to try find more accurate settings.
>2) According to your experience what could be the reason for some boards are working
>and some are not in same production batch ?
variations of chip characteristics (using example of power consumption and associated with it temperature)
are described in AN5215 iMX6 Temperature Sensor Module part B.2. Die process variation
"Variations in die-to-die processing results in devices with a range of power consumptions.
These variations cause two individual parts that are manufactured identically behave
differently. Comparing the upper and lower extremes of the top histogram in Figure 5,
devices can be up to 2 W different. Using a thermal resistance of 12 degrees Celsius
per Watt, there is a difference of up to 24°C, as shown on the bottom histogram in Figure 5"
https://www.nxp.com/docs/en/application-note/AN5215.pdf
So one can pay attention to processor power supplies noise and requirements for them
(like ripples, filtering) provided in i.MX6 System Development User’s Guide
https://www.nxp.com/docs/en/user-guide/IMX6DQ6SDLHDG.pdf
Best regards
igor
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