Hello everyone,
I am currently working on a board bring-up with the following combination of SOC, RAM and Software for the RAM-Stresstest:
- i.MX 8M Plus (1600 MHz) + Micron LPDDR4 4GB (MT53D1024M32D4DS)
- DDR Stresstest "mscale_ddr_tool_v3.21"
I have used the NXP RPA Excel sheet for generating the according ".ds"-file for the Stresstest program.
The question is as following:
Why does the Stresstest run smoothly and without errors, even under temperature fluctuations, when chosing 2000 MHz as the single frequency for the test, but fails when i chose the same parameterset, but now with three frequency points enabled. In that case the default, additional 200 MHz and 50 MHz, are tested as well.
Thats especially strange, because the first frequency point under test is 2000 MHz and the test fails immediately at the first iteration during the "memcpy SSN armv8_x32 test", where the 2000 MHZ frequency point is used (?!?!).
Bottomline:
1)How can it be that the same parameterset in the RPA sheet functions perfectly when only testing the highest, most layout/time critical frequency, but fails when i only enable the additional much lower frequency testpoints?
Any help is hugely appreciated
Greetings
Niko
