Meanwhile I have upgraded to RPA22 and using the latest DDR stress test tool. I'm running the memory at 1524MHz during testing to add a little margin for device variations. The iMX8M-mini on our board is the consumer temperature grade. The DDR stress test tool runs OK with the clock frequency set to 1600MHz and the ARM core voltage set to 1V.
When using the memtester tool under Linux I'm getting into a very weird situation.
When locking the maximum frequency of the CPU to 1600MHz and setting the ARM core voltage to 0.90V, I get a memtester failure every 2 loops (so half the test loop fail). Also the board consumes about 3.15W
With the ARM core voltage set to 1.00V, the number of memtester failures drops to less than 10%. BUT the the power consumption also drops to 2.35W.
So when the ARM core voltage is increased, the power consumption lowers by about 0.8W and the memory starts to work much better. How can this happen?
Both tests use the exact same software. Only the kernel DTB file is modified to change the core voltage.
Kernel version: 5.10.72
Other voltages: VDD_SOC = 0.85V, VDD_DRAM = 0.95V, NVCC_DRAM_1V1= 1.1V
Edit:
1) the temperature of the iMX8M-mini is also higher (4 degrees) when the board dissipates more current so the extra power dissipation happens inside the iMX8M-mini as well.
2) When I used the DDR stress test tool, the power consumption is higher with the ARM core voltage set to 1,00V compared to when the ARM core voltage is set to 0,90V.