Hello Joseph,
Thanks for the swift reply. However I am not sure whether the proposed topics are applicable to my usecase of JTAG/boundary scan testing.
I am creating a test for a PCB/board hosting an iMX6, using boundary scan only. I am not accessing any internal resources (registers) such as the memory controller. Instead I am only toggling IO pins by scanning in/out vectors over the JTAG interface. This works fine for all IO connections I need to test, except for the SDRAM IOs. The SDRAM test does work occassionally but also fails often, which leads me to think there is an issue with the default IO settings of the SDRAM pins in boundary scan JTAG mode.
Can I influence the IO settings (drive strength, termination, ...) when using the device in JTAG boundary scan mode only?
I suspect I can use the 'ENABLE_ExtraDebug' JTAG instruction to set applicable register(s) correctly, but the reference manual only documents 8 registers (addr 0 to 7) that are not applicable to the IOs. I do think I need this 'ENABLE_ExtraDebug' instruction because I received a JTAG command from XJTAG that fixes an erratum boundary scan issue (ERR009218) I was also having. It fixes it by setting a better drivestrength value to EIM pins. This is a write to a (undocumented in the RM) register at addr 11.
It would be nice to get the documentation on all JTAG 'Enable_ExtraDebug' registers that influence IOs, and especially SDRAM pin related registers.
BR,
Bert