KW36A getting disconnect from phone during EMC test

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KW36A getting disconnect from phone during EMC test

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kuldeep_chaturv
Contributor II

Hi,

We are using KW36A in our project.

this product suppose to be used in 2W and 4W, and hence electromagnetic testing is been performed.

one such test is call BCI test. 

with the following condition it is been performed:

DUT is connected with a phone over HID profiles and custom profiles.

temp: room temperature.

voltage: +13v

operating mode: IGN/+B ON

frequency range: 1 to 2000 MHz

Freq Steps: 1 to 20 Mhz: 5%, 20 to 2000 Mhz  :2%

Electromagnetic field: 72mA

Modulation: AM(1kHz,80%)

Dwell Time: 2 Sec.

Expected result: for all the interference frequencies device should remain connected.

Actual result: The device got disconnected in the BCI testing at 190 Mhz. 

Could you please let us know what could be the reason for this failure and how can it be debugged and fix?

thanks in advance.

Br,

Kuldeep

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mario_castaneda
NXP TechSupport
NXP TechSupport

Hi Kuldeep,

Could you please let us know what could be the reason for this failure and how can it be debugged and fix?

The EMC test can't be debugged by software. I recommend the next links that could be useful for the design.

Hardware Design Considerations for MKW35A/36A/35Z/36Z

FRDM-KW36 Co-existence with RF System Evaluation Report

FRDM-KW36 Minimum BoM Development

The frequency that you are seeing the disconnection is because you have a trace that is resonating at that frequency and you are getting some issues with the harmonic.

Regards,

Mario

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james_zhang
NXP Employee
NXP Employee

Its conduction test and injecting noise into power supply. It should be covered by power supply circuit, suggest customer to add filter before powering KW36. Thanks,

James