Hi Richard,
We did some tests with your proposal (CLAMP). It really seems to work like this. We load the boundary scan with EXTEST (or also sample/preload, it behaves the same). All pins are high-z. Then we go to CLAMP, after this, the output is driven as specified in EXTEST before. This means we can use this approach to drive signals.
Unfortunately, this doesn't solve our whole problem. We would like to program the NAND over boundary scan. To do this we would have to toggle many pins over EXTEST. But every time we go into EXTEST, all signals are high-z and therefore lose their current state. This leads to signal edges which don't allow us to program the NAND flash.
Do you have any idea how we could solve this? Is there any other way of loading the boundary scan chain with values other than using EXTEST and PRELOAD? Are there any undocumented JTAG modes on the Vybrid like INTEST, etc?
Another solution would be to load code directly into internal RAM of the Vybrid. We could then write some code which writes to the NAND flash. Do you have any documentation for Vybrid about how to load code over JTAG to internal SRAM and execute it?
Thanks a lot,
Roman