Hi Raul,
Leakage is an unspecified and therefore not guaranteed performance characteristic of our devices. However, NXP does perform a 100% leakage test on all ported devices after assembly, with a maximum allowable leakage rate (for these devices) of 0.133kPa/sec (with 100kPa applied by a no-added-volume test system). This maximum rate can be considered "worst case" (prior to any handling/processing by the customer which may induce package stresses which affect port-to-package sealing) and the typical production distribution for leakage rate is much better. That said however, our current process and equipment capabilities do not allow us to build and test to (or guarantee) a tighter requirement.
I hope you find this information useful.
Best regards,
Tomas
